Thin Film Processes 1991
DOI: 10.1016/b978-0-08-052421-4.50011-3
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Thermal Chemical Vapor Deposition

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Cited by 27 publications
(17 citation statements)
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“…The atmospheric pressure chemical vapor deposition (APCVD) and reduced pressure chemical vapor deposition (RPCVD) processes operate at atmospheric pressure or slightly below (10 4 -10 5 Pa(75-750 Torr)) [11]. Figure 3.52 represents an AP-CVD/RPCVD tube reactor.…”
Section: Atmospheric and Reduced Pressure Cvd (Apcvd/rpcvd) Reactormentioning
confidence: 99%
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“…The atmospheric pressure chemical vapor deposition (APCVD) and reduced pressure chemical vapor deposition (RPCVD) processes operate at atmospheric pressure or slightly below (10 4 -10 5 Pa(75-750 Torr)) [11]. Figure 3.52 represents an AP-CVD/RPCVD tube reactor.…”
Section: Atmospheric and Reduced Pressure Cvd (Apcvd/rpcvd) Reactormentioning
confidence: 99%
“…Viscous flow occurs at a pressure of 1 % of atmospheric pressure (10 3 Pa) or above [1,11]. This pressure range is typical for most CVD systems.…”
Section: Viscous Flowmentioning
confidence: 99%
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“…Las capas de silicio epitaxial depositadas a travŽs de la descomposici-n del silano (SiH 4 ) constituyen quiz ‡s el ejemplo m ‡s paradigm ‡ti-co. Actualmente, y debido a su gran versatilidad, las diferentes tŽcnicas de CVD constituyen hoy d'a una de las v'as m ‡s utilizadas en la obtenci-n de recubrimientos s-lidos de mayor implantaci-n industrial (2). As', mediante CVD es posible sintetizar un gran noemero de materiales de propiedades muy diversas (metales, semiconductores, aislantes, superconductores, materiales ferroelŽctricos y ferromagnŽticos, pol'meros, etc.…”
Section: Introducciînunclassified
“…Many basic works (Ref [8][9][10][11][12][13] showed the importance of controlling the gas hydrodynamics whose complexity, especially in terms of instability (Ref 12,13), required strong numerical efforts to be accurately described by computational fluid dynamics. Special efforts were also carried out to determine the reaction mechanisms at the origin of thin film deposition (Ref [14][15][16].…”
Section: Introductionmentioning
confidence: 99%