Abstract:With scaling of technology and increasing design sizes, thermal issues are emerging to be one of the major concerns for modern Very-Large-Scale Integration (VLSI) testing due to both increasing power densities and higher reliability requirements. However, in all existing thermal-aware test scheduling research, test schedule is computed a priori as a static schedule using an estimate of the power consumed by each test. Due to the popular peak power model and increasing process variations, estimated test power v… Show more
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