2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014 2014
DOI: 10.1109/apec.2014.6803682
|View full text |Cite
|
Sign up to set email alerts
|

Thermal analysis of a submodule for modular multilevel converters

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
5
0

Year Published

2015
2015
2019
2019

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 10 publications
(5 citation statements)
references
References 7 publications
0
5
0
Order By: Relevance
“…In addition to the four restrictions mentioned previously, the junction temperature limits of the IGBT devices must be respected when designing VSCs. The maximum specified operating temperature for high power IGBT modules is usually 125 o C. This is typically not a concern in MMCs due to the high efficiency which results in relatively low junction temperatures [22], [24]. In [10] however, it was found that utilizing circulating currents to achieve an overload capability of 30% causes approximately a 20 o C increase in the steadystate junction temperatures, when compared against the case where the converter is operating at rated power.…”
Section: MMC Overload Capabilitymentioning
confidence: 99%
“…In addition to the four restrictions mentioned previously, the junction temperature limits of the IGBT devices must be respected when designing VSCs. The maximum specified operating temperature for high power IGBT modules is usually 125 o C. This is typically not a concern in MMCs due to the high efficiency which results in relatively low junction temperatures [22], [24]. In [10] however, it was found that utilizing circulating currents to achieve an overload capability of 30% causes approximately a 20 o C increase in the steadystate junction temperatures, when compared against the case where the converter is operating at rated power.…”
Section: MMC Overload Capabilitymentioning
confidence: 99%
“…Each switching loss in S 1 and S 2 is given by (27) and (28) respectively. Similarly, each recovery loss in D 1 and D 2 is given by (29) and (30) respectively.…”
Section: Calculation Of Switching Loss and Recovery Lossmentioning
confidence: 99%
“…Second, in terms of the heat sink design, the loss analysis and the breakdown of the semiconductor losses have been reported in the chopper cell type MMC (27) (28) . Besides, the evaluation of the heat sink volume in IGBTs with the voltage rating of which varies from 600 V to 6.5 kV has been also discussed (29) .…”
Section: Introductionmentioning
confidence: 99%
“…In that case, the switching frequency of that SM will be lower, since the charging and discharging processes of the SM with a high value of C i is slower, while the other SMs will be penalized to be inserted and bypassed more often, as it is summarized in Table II. However, the unequal switching operation has a significant impact only on the switching losses of the S l , which is usually the device with the highest loading (at unity power factor) [7]- [10]. The turn-on and the turn-off energy of the lower IGBT S l are much higher than the other IGBT from the SM.…”
Section: Thermal Unbalance Related To the Switching Lossesmentioning
confidence: 99%
“…In contrast, the balancing of power losses and junction temperature of the power devices from the SMs are usually not taken in consideration. In MMC applications, the power losses distribution of the devices from the same SM is usually unequal, depending on the operating condition which is mainly determined by the power factor [7]- [10]. For the half-bridge type SM, the most unequal device loading occurs when the MMC operates at unity power factor, which is a typical operating condition for the HVDC applications [11].…”
Section: Introductionmentioning
confidence: 99%