Thermal analysis and design for high power GaAs PCSS

Zhao, Yue; Xie, Weiping; Liu, Hongwei

doi:10.1109/ipmhvc.2014.7287220

Cited by 2 publications

(2 citation statements)

References 3 publications

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“…Similarly to the current density in figure 5(a), the transient currents also present the classic lock-on phenomena, which also verifies the HG mode of the GaAs PCSS, as shown in figure 5(b). Normally, the filamentary current with high-density carriers degrades the switch due to Joule heating during the lock-on period [27]. The corresponding diameter of the filamentary current in the experiments can be calculated quantitatively by [28] where d lock is the diameter of the filamentary current, S e is the cross-sectional area of the filamentary current, I lock is the current intensity, and J lock is the current density, all of which are during the lock-on period.…”

Section: Photoexcited Carrier Dynamicsmentioning

confidence: 99%

Photoexcited carrier dynamics in a GaAs photoconductive switch under nJ excitation

Xu¹,

Wang²,

Li³

et al. 2022

Plasma Sci. Technol.

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The bunching transport of photoexcited carriers in an GaAs photoconductive semiconductor switch (PCSS) with interdigitated electrodes is investigated under the femtosecond laser excitation. The continuous outputs featured with high-gain (HG) characteristic are obtained at single-shot and 1-kHz by varying the optical excitation energy. An ensemble three-valley Monte Carlo simulation is utilized to investigate the transient characteristics and the dynamic process of photoexcited carriers. It demonstrates that the presence of plasma channel can be attributed to the bunching of high-density electron-hole pairs, which transports in the form of the high-density filamentary current. Results provide the pictures of the evolution of photoexcited carriers during the transient switching. The photoinduced heat effect is analyzed that reveals the relative failure mechanism at optical excitation at repetition rates.

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Section: Photoexcited Carrier Dynamicsmentioning

confidence: 99%

Photoexcited carrier dynamics in a GaAs photoconductive switch under nJ excitation

Xu¹,

Wang²,

Li³

et al. 2022

Plasma Sci. Technol.

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“…As the "blood vessels" and "meridians" of the power grid, the operation and health status of power cables are directly related to the safe and stable operation of the distribution network [1,2]. Cable joints are the weakest link in the insulation of cable systems, and their faults have always been high in the proportion of cable faults [3][4][5].…”

Section: Introductionmentioning

confidence: 99%

Temperature Field Calculation and Thermal Circuit Equivalent Analysis of 110 kV Core Cable Joint

Zhang,

Deng,

Liang

et al. 2024

Processes

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In order to indirectly calculate the core temperature of a cable joint, an equivalent transient thermal circuit model of single-core cable joint by considering axial heat dissipation is proposed. Firstly, the temperature field of the middle joint of a 110 kV single-core cable is calculated by finite element method. Based on the heat dissipation path of the core, an improved equivalent thermal circuit model is proposed. The axial heat dissipation of the cable joint core is simplified to a thermal resistance and the temperature rise of the cable body core, the temperature calculation of the cable joint transient process is realized. Compared with the results of finite element simulation, the steady-state temperature errors of the thermal circuit model are within 1 °C, while the maximum temperature errors of the transient process shall not exceed 3 °C, which proves the validity of the model. This method can provide reference for temperature inversion and the dynamic current-carrying capacity prediction of cable joints.

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Thermal analysis and design for high power GaAs PCSS

Cited by 2 publications

References 3 publications

Photoexcited carrier dynamics in a GaAs photoconductive switch under nJ excitation

Photoexcited carrier dynamics in a GaAs photoconductive switch under nJ excitation

Temperature Field Calculation and Thermal Circuit Equivalent Analysis of 110 kV Core Cable Joint

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