Theory of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>Z</mml:mi></mml:math>-scan measurements using Gaussian-Bessel beams

Hughes, S.; Burzler, J. M.

doi:10.1103/physreva.56.r1103

Cited by 53 publications

(18 citation statements)

References 16 publications

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“…In summary, alone for a colorant (crystal violet) we observed an increasing in [∆Τ p,v ] using the Z-scan technique with a Bessel-Gauss beam, as it is mentioned in [3]. Also, the distance between the peak and valley for figures 5, 8 and 6, 9 remain constant; nevertheless this distance for the figure 7 is greater than the distance for the figure 4.…”

Section: Co Clusio Ssupporting

confidence: 71%

Experimental Z-scan Measurements Using Gaussian-Bessel Beams

Otero¹,

Carrasco²,

Castillo³

et al. 2008

AIP Conference Proceedings

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Z-scan technique is a simple and widely used experimental method to measure the nonlinear refractive index of optical materials. Typically a longitudinal scan of the sample to test around the waist of a Gaussian beam is performed and the transmitted optical power is measured, in far field condition through a small aperture by a photodiode, as function of the position. Several modifications to the Z-scan technique have been proposed to increase its sensitivity [1-3]. One of these papers suggests theoretically the gradual transformation of the Gaussian beam to Bessel-Gauss beam [3] to increase the sensitivity by a factor of 40. In this work we present experimental results of Z-scan measurements using a focused Gaussian beam from a cw He-Ne in combination with an axicon to obtain a Bessel-Gauss beam to implement the z-scan technique. The results obtained show an increasing in the amplitude of the curve when is compared with the conventional Z-scan results for this type of samples.

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Section: Co Clusio Ssupporting

confidence: 71%

Experimental Z-scan Measurements Using Gaussian-Bessel Beams

Otero¹,

Carrasco²,

Castillo³

et al. 2008

AIP Conference Proceedings

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“…In addition, Cerenkov second-harmonic generation by nondiffracting Bessel beams in bulk optical crystals was also suggested in (Pandit & Payne, 1997). The application of Bessel beams to increase the Z-scan sensitivity in measurement was demonstrated in (Hughes & Burzler, 1997). The radially polarized Bessel beams were applicable to accelerate the particles of the electron beam (Tidwell et al, 1992).…”

Section: Applications and Conclusionmentioning

confidence: 99%

Pseudo-Bessel Beams in Millimeter and Sub-Millimeter Range

Yu¹,

Dou²

2010

Advanced Microwave and Millimeter Wave Technologies Semiconductor Devices Circuits and Systems

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“…Top-hat beam 9,10 and eclipsing Z scan 11 were used to enhance the sensitivity of the Z scan, and optically thick materials [12][13][14] were utilized to increase the signal. A recent study, 15 however, has shown that even with a slight deviation from a perfect Gaussian beam distribution, the Z-scan curve will give erroneous optical nonlinear parameters. In addition, in real optical limiters the incident beam distribution is not Gaussian, but most likely resembles top-hat beam shapes or some other asymmetric shape.…”

Section: Introductionmentioning

confidence: 97%

Two-dimensional Z scan for arbitrary beam shape and sample thickness

Chen

Oulianov

Tomov

et al. 1999

Journal of Applied Physics

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A two-dimensional Z-scan technique has been developed using a two-dimensional charge-coupled device (CCD) detector to study the nonlinear optical properties and beam profile evolution within optical limiting devices. Using the split step beam propagation method, the far field pattern at each Z position can be calculated precisely for any arbitrary beam shape and sample thickness. A two-dimensional far field pattern is recorded by the CCD detector, and the evolution of the beam distribution inside the nonlinear optical medium can be obtained directly. This technique has been applied to study the nonlinear optical parameters and laser beam profiles in nonlinear liquids. We have used thin and thick samples and Gaussian, top-hat and split Gaussian beam distributions, and the experimental results agreed very well with the calculation. This technique also offers a simple and accurate means for optimizing the design of optical limiting devices.

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Theory ofZ-scan measurements using Gaussian-Bessel beams

Cited by 53 publications

References 16 publications

Experimental Z-scan Measurements Using Gaussian-Bessel Beams

Experimental Z-scan Measurements Using Gaussian-Bessel Beams

Pseudo-Bessel Beams in Millimeter and Sub-Millimeter Range

Two-dimensional Z scan for arbitrary beam shape and sample thickness

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