Theory of light‐induced force microscopy to observe collective excited states in quantum‐dot‐array

Iida, Takuya; Ishihara, Hajime

doi:10.1002/pssc.200880605

Cited by 1 publication

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“…This idea was further refined theoretically [19][20][21]. Later, Iida and Ishihara studied the effect of light induced force microscopy of resonant quantum dot systems [22][23][24].…”

Section: Indirect Effects Of Optical Fieldsmentioning

confidence: 99%

Optically induced forces in scanning probe microscopy

et al. 2014

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Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

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“…This idea was further refined theoretically [19][20][21]. Later, Iida and Ishihara studied the effect of light induced force microscopy of resonant quantum dot systems [22][23][24].…”

Section: Indirect Effects Of Optical Fieldsmentioning

confidence: 99%