Theory of High Field Conduction in a Dielectric

O'Dwyer, J. J.

doi:10.1063/1.1657111

Cited by 94 publications

(16 citation statements)

References 4 publications

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“…(ii) The small ionization ID model, when hole drift opposes ionization and the product of the ionization coefficient , and insulator thickness w, ~,w < 1 (32,35). (iii) The large ionization ID model; as described under (ii), but with ~w > 1.…”

Section: Deterministic Models Of Breakdown By Impact Ion-mentioning

confidence: 99%

Electrical Breakdown: I . During the Anodic Growth of Tantalum Pentoxide

Kadary

Klein

1980

J. Electrochem. Soc.

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Observations are presented on breakdown events during the anodic growth of tantalum pentoxide in characteristics which plot the rate of breakdown as function of oxide thickness at constant field, F . The characteristics shift to lower thicknesses for an increase in field, or a decrease in temperature. The breakdown process is interpreted by the stochastic succession of avalanche breakdown model. An approximate relation was derived for the rate of breakdown as function of insulator thickness. This relation could be well fitted to experimental data at various fields. The fitting procedure permits the evaluation of the coefficient of impact ionization α, finding for a set of anodizations α=4.4×106expfalse(−21.5/Ffalse)/normalcm with F in MV/cm, in the range of fields 6.1–6.7 MV/cm. There is an uncertainty of roughly ±10% in α, due to shallow minima in fitting procedures, to fluctuations in the rate of breakdown, and to some uncertainty in the magnitude of F .

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Section: Deterministic Models Of Breakdown By Impact Ion-mentioning

confidence: 99%

Electrical Breakdown: I . During the Anodic Growth of Tantalum Pentoxide

Kadary

Klein

1980

J. Electrochem. Soc.

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“…The classical solid dielectric breakdown theory includes intrinsic breakdown, avalanche breakdown, thermal breakdown, and electro-mechanical breakdown, which were established by A. von. Hippel [ 7 , 8 , 9 , 10 , 11 , 12 , 13 , 14 ], H. Frohlich [ 15 , 16 , 17 , 18 , 19 , 20 , 21 ], and F. Seitz [ 22 , 23 , 24 , 25 , 26 , 27 , 28 ] and later refined by G. C. Garton [ 29 ], S. Whitehead [ 30 , 31 ], and J. J. O’Dwyer [ 32 , 33 , 34 ]. The classical breakdown theory mainly focuses on questions such as the difference between intrinsic breakdown and avalanche breakdown, the relation between electric breakdown strength ( E BD ) and dielectric thickness ( d ), the dependence of E BD on temperature ( T ), and the tendency of E BD in applied waveforms, etc.…”

Section: Introductionmentioning

confidence: 99%

Review and Mechanism of the Thickness Effect of Solid Dielectrics

Zhao

Liu

2020

Nanomaterials

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The thickness effect of solid dielectrics means the relation between the electric breakdown strength (EBD) and the dielectric thickness (d). By reviewing different types of expressions of EBD on d, it is found that the minus power relation (EBD = E1d−a) is supported by plenty of experimental results. The physical mechanism responsible for the minus power relation of the thickness effect is reviewed and improved. In addition, it is found that the physical meaning of the power exponent a is approximately the relative standard error of the EBD distributions in perspective of the Weibull distribution. In the end, the factors influencing the power exponent a are discussed.

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“…For thin films of nm thickness, a high electric field assists the diffusion of ionic point defects necessary for oxidation reactions. 158 One hypothesis is that film growth is dependent on the migration of interstitial cation vacancies from the film/solution interface to the metal/film interface where the rate-limiting step is cation injection. The uniform electric field produces a shift in the Fermi level across the film, also called the Mott potential, which drives ionic transport and electron tunneling.…”

Section: Overview Of Metallic Corrosionmentioning

confidence: 99%

A comparative review of the aqueous corrosion of glasses, crystalline ceramics, and metals

et al. 2018

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All materials can suffer from environmental degradation; the rate and extent of degradation depend on the details of the material composition and structure as well as the environment. The corrosion of silicate glasses, crystalline ceramics, and metals, particularly as related to nuclear waste forms, has received a lot of attention. The corrosion phenomena and mechanisms of these materials are different, but also have many similarities. This review compares and contrasts the mechanisms of environmental degradation of glass, crystalline ceramics, and metals, with the goal of identifying commonalities that can seed synergistic activities and advance the current knowledge in each area.npj Materials Degradation (2018) 2:15 ; doi:10.1038/s41529-018-0037-2 INTRODUCTIONNew research activity focused on the environmental degradation of silicate glasses, crystalline ceramics, and metals relevant to nuclear waste forms and containers has recently been described.

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Theory of High Field Conduction in a Dielectric

Cited by 94 publications

References 4 publications

Electrical Breakdown: I . During the Anodic Growth of Tantalum Pentoxide

Electrical Breakdown: I . During the Anodic Growth of Tantalum Pentoxide

Review and Mechanism of the Thickness Effect of Solid Dielectrics

A comparative review of the aqueous corrosion of glasses, crystalline ceramics, and metals

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