Theory of charge exchange scattering from surfaces

Bloss, Walter L.; Hone, Daniel

doi:10.1016/0039-6028(78)90296-0

Cited by 193 publications

(32 citation statements)

References 14 publications

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“…Here we have not discussed the quasiresonant core-level neutralization that takes place for some ion-target combinations, like, e.g., He ϩ -Pb, 34,37 since it is a rather exceptional process that yields an oscillatory neutralization behavior as a function of the velocity.…”

Section: Neutralization Probabilitymentioning

confidence: 99%

Work function dependent neutralization of low-energy noble gas ions

et al. 2002

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The work function dependence of the neutralization of low-energy He ϩ , Ne ϩ , and Ar ϩ ions was studied by determining the neutralization probability of ions scattered from submonolayer coverages of Ba on W͑110͒ and Re͑0001͒ substrates. At high work functions ͑Ͼ3.5 eV͒, it was found that the dominant neutralization mechanism for noble gas ions with initial energy between 2 and 5 keV scattering from Ba is collision-induced neutralization. The neutralization probability for this mechanism was found to be insensitive to work function changes. We argue that collision-induced neutralization is also the dominant charge transfer process for scattering from other earth-alkali and alkali elements in this energy range, although at lower energies it is expected that Auger neutralization will become important. At work functions below roughly 3.5 eV, resonant neutralization to the first excited level of the noble gas ions occurs in addition to the charge transfer processes operating at high work functions. We show that the additional neutralization at low work functions can be described using resonant charge exchange theory. Due to resonant neutralization, the neutralization probability for noble gas ions increases exponentially with decreasing work function.

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Section: Neutralization Probabilitymentioning

confidence: 99%

Work function dependent neutralization of low-energy noble gas ions

et al. 2002

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“…10 To determine the ionization efficiency at even lower velocities, the angular dependence of the ion yield was measured for 10 eV Al + ions sputtered by 2 keV Xe + . The complete set of ionization probabilities was compared to a calculation based on the independent-particle nonadiabatic model, 11,12 which has been successfully used in describing scattering data. The analysis shows that this simple model can reproduce the experimental data for both sputtered and recoiled Al, although a higher surface electronic temperature must be utilized for sputtered particles.…”

Section: Introductionmentioning

confidence: 99%

Ionization of Al recoiled and sputtered from Al(100)

2005

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The absolute ionization probability of energetic ͑Ͼ500 eV͒ particles recoiled from Al͑100͒ by 2 and 5 keV Xe + bombardment was measured with time-of-flight spectroscopy. These values were then used to calibrate the energy and angular distributions of low-energy ͑10-600 eV͒ sputtered ions collected with an electrostatic analyzer. The independent-particle model of nonadiabatic surface-atom charge exchange, which is typically used to analyze single scattering events, was applied to the ion fractions of the recoiled and sputtered atoms. The model describes all the experimental data from a few eV to the keV range if a different surface electronic temperature is used for recoiling and sputtering. This suggests that the ionization process depends on the instantaneous surface condition at the time of ion emission.

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“…It i s well known tha t the resona nt charg e tra nsf er b etween two ato m s (i n the absence of the surf ace) l eads to p eri o di c i n 1 oscil l ati ons o f the appro pri ate o ccupati on num b ers, b eing the rel ati ve velo city of ato m s [25,30]. Here we ha ve extended the i nv estiga ti ons of the 1 dependence of the o ccupati on numb ers to the case of ato ms scattered on the adsorb ed ato m ( = 0 ) or i n som e di stance fro m i t. For a rel ati vely l arg e di sta nce of the coll i sion pl ace fro m the adsorb ed ato m ( = 1 0 or = 1 5 a.u. )…”

Section: Introductionmentioning

confidence: 99%