Theory for confocal and conventional microscopes imaging small dielectric scatterers

Török, Péter; Higdon, P. D.; Wilson, Tony

doi:10.1080/09500349808230662

Cited by 69 publications

(41 citation statements)

References 7 publications

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“…Subsystem III has been studied less often in the literature. Subsystem III of a microscopy system without SIL was first analyzed vectorially by Sheppard and Wilson [38], and later by Török et al [39][40][41], Enderlein [42], and Guo et al [43]. Recently, the dyadic Green's function (DGF) for subsystem III corresponding to a microscopy system with an aplanatic SIL (ASIL) was analytically derived [44].…”

Section: Introductionmentioning

confidence: 99%

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Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens

et al. 2012

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A general model of a subsurface microscopy system based on an aplanatic solid immersion lens (ASIL) is presented. This model is composed of three components: generation of incident light into the ASIL, interaction of the incident light with the sample, and imaging of the scattered light. Interaction of incident light with sample can be calculated numerically using electromagnetic scattering theory, while vector diffraction theory is used to treat the other two components. Examples of imaging small and extended scatterers are shown. For small scatterers, we show the differences between the actual resolution of the whole system and the resolution predicted by considering only one subsystem of the whole system. For extended scatterers, two types of illuminations-focusing light illumination and plane wave direct illumination-are used to image the scatterers, and observations are explained using interaction of the incident light with the sample.

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Section: Introductionmentioning

confidence: 99%

“…Based on the DGF, the resolution of Subsystem III of the ASIL microscopy system was explicitly investigated [45]. Work presented in [38][39][40][41][42][43][44][45] is helpful in understanding subsystem III, i.e., imaging of the scattered light.…”

Section: Introductionmentioning

confidence: 99%

Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens

et al. 2012

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“…Equations delivering the field at high focusing angles (Richards & Wolf, 1959; van der Voort & Brakenhoff, 1990; Hell & Stelzer, 1992; Hell et al ., 1993; Sheppard & Török, 1997; Török et al ., 1998) are readily adapted to annular apertures. However, real objective lenses might behave differently because other sources of depolarization may also play a role.…”

Section: Introductionmentioning

confidence: 99%

Electric field depolarization in high aperture focusing with emphasis on annular apertures

Bahlmann

Hell

2000

Journal of Microscopy

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Electromagnetic focusing theory of light predicts that at high apertures field components arise that are polarized perpendicular to the initial polarization. Although vectorial depolarization has received considerable attention in focusing theory, no evidence has been presented as to its relevance in experiments. We measure the intensity of the perpendicularly orientated field in the focal region by utilizing monomolecular, fluorescent polydiacetylene layers whose transition dipoles are orientated in a single direction. For a 1.4 numerical aperture oil objective lens illuminated with linearly x‐polarized light, we find that the integral of the modulus squared of the y‐polarized focal field amounts to 1.5% of its x‐polarized counterpart. In particular, we show here that the depolarization increases when using annular apertures. Annuli formed by a central obstruction with a diameter of 89% of that of the entrance pupil raise the integral to 5.5%. This compares well with the value of 5.8% predicted by electromagnetic focusing theory; however, the depolarization is also due to imperfections connected with focusing by refraction. Besides fluorescence microscopy and single molecule spectroscopy, the measured intensity of the depolarized component in the focal plane is relevant to all forms of light spectroscopy combining strong focusing with polarization analysis.

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“…Meanwhile various virus as the nature nanoparticle is a key threat to human health so it is of importance to use optical technique for early detection. For detecting single nanoparticle various techniques are reported [3][4][5], however all of these methods are mainly based on the Mie theory and through measuring the absorption cross sections, the intensity of the nanoparticles, optical gradient forces or scattering field amplitude. While in this paper, we show a model to calculate the electric amplitude and phase field distribution of single nanoparticle by using finite-difference time-domain (FDTD) method.…”

Section: Introductionmentioning

confidence: 99%

“…The calculation procedure is explained as follows. Firstly, we calculate the illuminating electric field using the generalized Jones matrix formulas introduced by the Tökör et al [5]. The Jones matrix is necessary to describe a change in the direction of propagation of plane waves in a ray traversing an optical system.…”

Section: Introductionmentioning

confidence: 99%

Amplitude and phase of single nanoparticle calculated using finite-difference time-domain method

Hong

Liu

2014

SPIE Proceedings

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In this work, we present a model to calculate the electric amplitude and phase field distribution of single nanoparticle by using finite-difference time-domain (FDTD) method. We model the light-nanoparticle interaction by using a liner polarization light to illuminate the single nanoparticle through immersion oil and glass substrate. The illumination is set as a cone of plane waves limited by the aperture of the objective. The scattering field summarized on a single detector is amplified by heterodyne interference with a reference light. The amplitude and phase distribution of particles with different diameters ranging from 50 nm to 2 micron are calculated.

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Theory for confocal and conventional microscopes imaging small dielectric scatterers

Cited by 69 publications

References 7 publications

Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens

Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens

Electric field depolarization in high aperture focusing with emphasis on annular apertures

Amplitude and phase of single nanoparticle calculated using finite-difference time-domain method

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