Theoretical Study of Ferroelectric and Optical Properties in the 180� Ferroelectric Domain Wall of Tetragonal BaTiO3

Chaib, H.; Otto, Tobias; Eng, Lukas M.

doi:10.1002/1521-3951(200209)233:2<250::aid-pssb250>3.0.co;2-1

Cited by 21 publications

(19 citation statements)

References 35 publications

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“…This optical contrast seems too large to be only due to pure topographical effect. We can also expect a certain contribution associated to the change of the refractive index at the domain walls (18). In Fig.…”

Section: Near-field Optical and Atomic Force Microscopy Studies On Rbsupporting

confidence: 60%

“…This means that a double size object produces an optical contrast similar than that from the domain wall step. Therefore, the changes produced in the transmission SNOM at the domain walls is due (almost fifty/fifty) to the topographic step produced by the etching process and the dielectric constant variation at the interface between domains and its vicinity (18). Additionally, we also observe a strong contrast modulation in the C + domain, which now is more evident in the image recorded at 660 nm.…”

Section: Near-field Optical and Atomic Force Microscopy Studies On Rbmentioning

confidence: 83%

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Estudios de microscopía óptica de campo cercano y de fuerza atómica en RbTiOPO4 monocristalino con dominios ferroeléctricos

Canet‐Ferrer¹,

Martı́n-Carrón²,

Valdés³

et al. 2006

Bol. Soc. Esp. Ceram. Vidr.

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We have developed a Scanning Near-Field Optic Microscope (SNOM), which is based on a commercial tuning-fork sensor, capable of measuring the topography and the optical signal, at the same time. We have measured the SNOM transmission, as well as the topography, of an RbTiOPO 4 single crystal, which exhibits two kinds of macroscopic ferroelectric domains. A chemical selective attack has been performed to distinguish them. As a consequence, we obtained zones with a noticeable roughness (C -) in comparison with the flat aspect of the other ones (C + ). The SNOM topography images have been compared to Atomic Force Microscopy ones, which has a better resolution. The changes observed in the transmission measurements are due to different effects: i) variations of the dielectric constant at the interface walls between domains; ii) light scattering, wavelength dependent, at the grains in the C -face. Finally, we have determined the angles formed at the domain-walls between inverted domains, which are measured to be higher than 90º and close to 135º, as could be expected, because of the combination between Estudios de microscopía óptica de campo cercano y de fuerza atómica en RbTiOPO 4 monocristalino con dominios ferroeléctricosHemos desarrollado un Microscopio Óptico de Campo Cercano (SNOM) que es capaz de adquirir una señal óptica, al mismo tiempo que la topografía, basado en un sensor de fuerza lateral comercial. Con este microscopio hemos medido la transmisión óptica en campo cercano, así como la topografía, de un cristal de RbTiOPO 4 , que exhibe dos tipos de dominios ferroeléctricos macroscópicos. Previamente, la muestra había sido sometida a un ataque químico selectivo, con el que se pueden distinguir dos zonas diferentes, una con una rugosidad apreciable (C -) y otra con aspecto perfectamente plano (C + ), aspecto que tenía la superficie antes del ataque. Hemos comparado las imágenes de topografía del SNOM con otras tomadas usando un Microscopio de Fuerzas Atómicas, con mayor resolución espacial. Los cambios observados en las medidas de transmisión son debidos a dos tipos de efectos: i) las variaciones en la constante dieléctrica en las paredes de dominios y sus cercanías; ii) la dispersión de luz, dependiente de la longitud de onda, en los granos de la cara C -. Por último, hemos determinado los ángulos que forman las paredes de dominios invertidos, que resultan ser mayores de 90º y bastante cercanos a 135º, en promedio, tal y como se podría esperar, debido a la combinación de las direcciones

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Section: Near-field Optical and Atomic Force Microscopy Studies On Rbsupporting

confidence: 60%

Section: Near-field Optical and Atomic Force Microscopy Studies On Rbmentioning

confidence: 83%

Estudios de microscopía óptica de campo cercano y de fuerza atómica en RbTiOPO4 monocristalino con dominios ferroeléctricos

Canet‐Ferrer¹,

Martı́n-Carrón²,

Valdés³

et al. 2006

Bol. Soc. Esp. Ceram. Vidr.

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“…These materials can support regions, known as ferroelectric domains, where the orientation of the spontaneous dipole moment is different from the surrounding crystal and are separated by domain walls. The width of the domain wall is reported to be only a few lattice constants wide [1][2][3][4][5][6][7][8][9] and constitutes a discontinuity of the crystal lattice. In this Letter, we studied the Raman scattering process in the presence of a domain wall.…”

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confidence: 99%

Influence of ferroelectric domain walls on the Raman scattering process in lithium tantalate and niobate

Stone

Dierolf

2012

Opt. Lett.

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We report changes in the Raman spectra at ferroelectric domain walls in near-stoichiometric LiNbO3 and stoichiometric LiTaO3. We find a decrease of intensity for the regular bulk Raman peaks along with increases of intensity in spectral regions that correspond to phonons, which propagate at an angle with respect to the incident light. In the backscattering geometry, such modes are not supported in the bulk crystal due to momentum conservation. We confirm that these changes are due to the domain wall itself and are independent of intrinsic defects or charging effects.

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“…At first sight, we can see that the reflectivity image mostly reproduces the topography of the sample (plus a high number of dust particles), which is not the case for the transmission image. In this image we observe clear contrasts, which are attributed to the change of the refractive index produced at the domain walls (16). The correlation between optical and mechanical information is considered one of the key issues in SNOM microscopy, necessary to interpret correctly optical images.…”

Section: Near-field Optical Microscopy Characterizationmentioning

confidence: 91%

Microscopías de barrido aplicadas al estudio de los dominios y las paredes de dominio en un cristal ferroeléctrico de KNbO3

Ferrer¹,

Martı́nez-Pastor²,

Carrón³

et al. 2006

Bol. Soc. Esp. Ceram. Vidr.

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A commercial Atomic Force Microscope (AFM) and a semi-home made Scanning Near-Field Optical Microscope (SNOM) have been used to characterize electrically, topographically and optically the domain walls among natural ferroelectric domains in a KNbO 3 crystal. The AFM measurements have been performed with a metallic coated tip in order to detect electrostatic forces between the polarization field at the ferroelectric surface and the tip. An external electric field has also been applied between the sample surface and the tip to tune this electrostatic interaction over the atomic forces. In optical transmission images, acquired under near field conditions, we observe a clear contrast of the signal at the domain walls between 180º spontaneous polarization domains; while the images of the surface topography, obtained simultaneously, show a reasonably flat surface of the crystal. The scanning probe microscopy techniques used in this work are valuable tools for the investigation of ferroelectric materials and, in particular, to characterize the domain walls, without needing a either especial preparation or damage of the sample surface. Keywords: KNbO 3 , ferroelectric, domain-wall, SNOM and AFM Microscopias de barrido aplicadas al estudio de los dominios y las paredes de dominio en un cristal ferroelectrico de KNbO 3 .Hemos utilizado un Microscopio de Fuerzas Atómicas (AFM) comercial y un Microscopio Óptico de Campo Cercano (SNOM) semi-casero para caracterizar eléctrica, óptica y topográficamente las paredes de dominio presentes entre los dominios ferroeléctricos naturales de un cristal de KNbO 3 . Las medidas de AFM las hemos realizado con una punta recubierta con metal, para detectar las fuerzas electrostáticas entre los campos de polarización de la superficie ferroeléctrica y la punta. Además, hemos aplicado campos eléctricos externos entre la superficie de la muestra y la punta, de manera que se pueda variar la fuerza electrostática en relación a las fuerzas atómicas. En imágenes de transmisión óptica, bajo condiciones de campo cercano, observamos un claro contraste de la señal en las fronteras entre los dominios ferroeléctricos con polarización espontánea a 180º, mientras que las imágenes de topografía muestran una superficie prácticamente plana. Las técnicas de microscopía de prueba usadas en este trabajo se revelan muy valiosas para la investigación de materiales ferroeléctricos y, en particular, para la caracterización de sus dominios y paredes de dominio, puesto que no es necesario preparar ni dañar la superficie de la muestra para ser investigada. Palabras clave: KNbO 3 , ferroeléctrico, pared de dominio, SNOM y AFM

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Theoretical Study of Ferroelectric and Optical Properties in the 180� Ferroelectric Domain Wall of Tetragonal BaTiO3

Cited by 21 publications

References 35 publications

Estudios de microscopía óptica de campo cercano y de fuerza atómica en RbTiOPO<sub>4</sub> monocristalino con dominios ferroeléctricos

Estudios de microscopía óptica de campo cercano y de fuerza atómica en RbTiOPO<sub>4</sub> monocristalino con dominios ferroeléctricos

Influence of ferroelectric domain walls on the Raman scattering process in lithium tantalate and niobate

Microscopías de barrido aplicadas al estudio de los dominios y las paredes de dominio en un cristal ferroeléctrico de KNbO<sub>3</sub>

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