2017
DOI: 10.1016/j.snb.2016.09.174
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Theoretical study of an evanescent optical integrated sensor for multipurpose detection of gases and liquids in the Mid-Infrared

Abstract: International audienceA theoretical study of evanescent optical sensor for multipurpose detection in the Mid-Infrared of gases and pollutants in water is presented in this paper. The opto-geometrical parameters of the transducers - ridge waveguides - have been optimized in order to obtain the highest evanescent power factor for monomodal propagation in the Mid-Infrared. The highest sensitivity has been obtained for a configuration with an optimal length of waveguide L-ops = 4.3 cm for intrinsic propagation los… Show more

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Cited by 63 publications
(49 citation statements)
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“…Given an NEP of 0.69 pW/Hz 1/2 and a factor of 166 / 2 6.4 = SNR enhancement from the Fellgett's advantage [213], the detector-limited noise-equivalent absorbance (NEA, given as the minimum detectable absorbance Γα′L) is NEP/ (0.18 μW)/6.4 = 6.0 × 10 −7 Hz −1/2 . Such an impressive NEA, while quoted in previous on-chip sensor performance projections [214], is challenging to attain in practice [215]. Empirically, NEA down to 8.5 × 10 −4 Hz −1/2 has been experimentally measured in on-chip waveguide sensors [216].…”
Section: Performance Projectionmentioning
confidence: 95%
“…Given an NEP of 0.69 pW/Hz 1/2 and a factor of 166 / 2 6.4 = SNR enhancement from the Fellgett's advantage [213], the detector-limited noise-equivalent absorbance (NEA, given as the minimum detectable absorbance Γα′L) is NEP/ (0.18 μW)/6.4 = 6.0 × 10 −7 Hz −1/2 . Such an impressive NEA, while quoted in previous on-chip sensor performance projections [214], is challenging to attain in practice [215]. Empirically, NEA down to 8.5 × 10 −4 Hz −1/2 has been experimentally measured in on-chip waveguide sensors [216].…”
Section: Performance Projectionmentioning
confidence: 95%
“…The optical waveguiding requires selenide layers with few µm thicknesses 10, 11 , consequently a long deposition time and/or a high deposition rate are required. Thus, it is quite important to control that any compositional drift during the deposition will be observed.…”
Section: Resultsmentioning
confidence: 99%
“…Indeed, to develop an optical integrated system for mid-IR sensors which requires precise opto-geometric characteristics of the chalcogenide layers 10 , it is essential to adequately determine the influence of deposition parameters. By the role discrimination of each factor and their possible correlation, it will be possible to control thin film characteristics such as thickness, refractive index, roughness, or chemical composition.…”
Section: Introductionmentioning
confidence: 99%
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