Theoretical investigation of diffusion and electrical properties of yttria-stabilized zirconia thin film

Investigation of diffusivity in nanometer‐thick yttria‐stabilized zirconia by chronoamperometry and its formalism

“…The basis of the calculations is deeply described in the previous work. 32 The results are also in Figure 8D. The experimental values are consistent with theoretical ones; the diffusivity increases as the YSZ thickness decreases.…”

“…Here, the pre‐exponential factor $$D_0^{{\mathrm{layer}}}$$is defined according to 32 and $$E_a^{{\mathrm{layer}}}$$ is the activation energy for oxygen vacancy migration in the crystal layers. Using the statistical moment method (SMM), the activation energy can be determined by the Helmholtz free energy changes of the crystal layers in the various states 32 …”

“…Theoretical calculations of the diffusion coefficient of YSZ films were done using the statistical moment method (SMM). The structure and configuration of the layers for the calculations are described in previous work 32 . The underlying idea is that by reducing the thickness of the YSZ electrolyte films to the nanometer scale, the discontinuity of the surface produces ionic interaction potential effects, increasing nanofilm conductivity.…”

“…Using the statistical moment method (SMM), the activation energy can be determined by the Helmholtz free energy changes of the crystal layers in the various states. 32…”

“…The structure and configuration of the layers for the calculations are described in previous work. 32 The underlying idea is that by reducing the thickness of the YSZ electrolyte films to the nanometer scale, the discon-tinuity of the surface produces ionic interaction potential effects, increasing nanofilm conductivity. Consequently, the structure of nanometer-thick YSZ films comprises two external crystal layers and 𝑛 − 2 internal crystal layers.…”