Theoretical and Empirical Evaluation of Surface Roughness Effects on Conductivity in the Terahertz Regime

Yang, Bong-Jun; Kirley, Matt; Booske, John H.

doi:10.1109/tthz.2014.2310121

Cited by 31 publications

(9 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In order to verify the revised surface roughness modeling method in terahertz band, the effective conductivity calculated is compared with actual measured conductivity. Taking gold for example, Yang et al give its measured conductivity in 400 GHz and 650 GHz when R q equals 160 nm, 190 nm and 210 nm, respectively [10]. Besides, Drude coefficients τ and σ 0 are also provided in [10].…”

Section: Corrections Of Surface Roughness Modeling Methods In Terahertmentioning

confidence: 99%

“…Taking gold for example, Yang et al give its measured conductivity in 400 GHz and 650 GHz when R q equals 160 nm, 190 nm and 210 nm, respectively [10]. Besides, Drude coefficients τ and σ 0 are also provided in [10]. With these coefficients, effective conductivity is calculated, and comparisons are shown in Table 1 and Table 2.…”

Section: Corrections Of Surface Roughness Modeling Methods In Terahertmentioning

confidence: 99%

“…The extraction process in gigahertz frequency has been described in Section 2. At terahertz band, to obtain experimental solutions, the Debye-type FR4 and the Drude-type gold are imported in HFSS software, where coefficients of Debye model and Drude model are in reference to Zhang's measured data [6] and Yang's measured data [10]. These materials are used to define the parameters of parallel plate waveguide model.…”

Section: Example Of Dielectric Parameters Extraction In Terahertz Bandmentioning

confidence: 99%

See 2 more Smart Citations

A Corrected Method to Extract Dielectric Parameters From Transmission Lines With Conductor Surface Roughness at Terahertz Frequencies

Huang¹,

Jia²,

Wang³

2017

PIER M

View full text Add to dashboard Cite

Abstract-"Curve-fitting" method is an important method to extract dielectric parameters of substrate materials from planar transmission lines. At gigahertz frequencies, effective conductivity concept is adopted to model the conductor's surface roughness effects in planar transmission lines, and differential extrapolation method is used to remove surface roughness effects. However, such a concept and method lose their accuracy at extremely high frequency such as terahertz waves. This paper details some new limitations in the terahertz regime and proposes corrections in calculating effective conductivity with rough conductor and curve-fitting method for transmission performance characterization in eliminating the effects of surface roughness. The proposed method is validated by simulation data for conductivity with parallel plate waveguide model, and the corrected method presented here can effectively extract dielectric parameters with an error less than 7%.

show abstract

Section: Corrections Of Surface Roughness Modeling Methods In Terahertmentioning

confidence: 99%

Section: Corrections Of Surface Roughness Modeling Methods In Terahertmentioning

confidence: 99%

Section: Example Of Dielectric Parameters Extraction In Terahertz Bandmentioning

confidence: 99%

See 1 more Smart Citation

A Corrected Method to Extract Dielectric Parameters From Transmission Lines With Conductor Surface Roughness at Terahertz Frequencies

Huang¹,

Jia²,

Wang³

2017

PIER M

View full text Add to dashboard Cite

show abstract

“…where 0 = 0 2 / * is the intrinsic bulk conductivity at direct current and is also adopted in the ANSYS HFSS, = 2 is the angular frequency, 0 , , and * , respectively, denote the free electron density, the electronic charge, and the effective mass of the electrons, and refers to the scattering relaxation time of the free electron (i.e., = 27.135 fs in [6], = 18.5 fs in [7]). According to the classical relaxation-effect model, the surface impedance ( ) and the skin depth of homogeneous metals with smooth surfaces are related to the complex conductivity ( ) by [8] …”

Section: The Analysis Of the Skin Depth And Metal Conductivitymentioning

confidence: 99%

Sub-Millimeter-Wave 10 dB Directional Coupler Based on Micromachining Technique

Liu¹,

Hu²,

Zhang³

et al. 2015

International Journal of Antennas and Propagation

View full text Add to dashboard Cite

A waveguide 10 dB directional coupler operating from 325 GHz to 400 GHz is designed based on the short-slot Riblet-type coupling configuration and fabricated using the deep reactive ion etching (DRIE) silicon micromachining technique. The skin depth and the conductivity of the gold film with the roughness of 0.2 m are investigated at 300∼1000 GHz frequency band for the higher accuracy. In order to measure the small-size four-port coupler using the two-port VNA with big-size flanges, three testing topologies are designed, in which the terahertz (THz) wedged-type absorbing material terminals are adopted as the waveguide matching loads. The measured average insertion loss is 0.5 dB after deducting the intrinsic loss and the measured average isolation is better than 25 dB, which are in good agreement with simulations. The analysis and the design are verified to be accurate and valuable for the high-performance sub-millimeter-wave waveguide components.

show abstract

“…This imperfection appeared as finite conductivity in the material and screening surface roughness, determined by the quality of its processing. For this reason, both theoretical [1][2][3][4] and experimental [5][6] studies have recently been devoted to investigating the influence of surface roughness on the characteristics of guiding electrodynamic structures.…”

Section: Introductionmentioning

confidence: 99%

Estimation of losses per unit length in a rectangular waveguide with rough screening surfaces based on the concept of partial waves

et al. 2019

View full text Add to dashboard Cite

A method for calculating the rough surface reflection coefficient of an electromagnetic wave is proposed. It is shown that the screening surface roughness in waveguides is equivalent to a decrease in conductivity of these surfaces in comparison with values belonging to Schukin-Leontovich boundary conditions for completely smooth surfaces. Examples of calculating the attenuation coefficient in the rectangular waveguide with rough screening surfaces in a terahertz frequency range are presented. The influence of the size and shape of the rough surface profile irregularities on the waveguide attenuation is studied.

show abstract

Theoretical and Empirical Evaluation of Surface Roughness Effects on Conductivity in the Terahertz Regime

Cited by 31 publications

References 19 publications

A Corrected Method to Extract Dielectric Parameters From Transmission Lines With Conductor Surface Roughness at Terahertz Frequencies

A Corrected Method to Extract Dielectric Parameters From Transmission Lines With Conductor Surface Roughness at Terahertz Frequencies

Sub-Millimeter-Wave 10 dB Directional Coupler Based on Micromachining Technique

Estimation of losses per unit length in a rectangular waveguide with rough screening surfaces based on the concept of partial waves

Contact Info

Product

Resources

About