2016
DOI: 10.1103/physrevb.94.125308
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Theoretical analysis of influence of random alloy fluctuations on the optoelectronic properties of site-controlled (111)-oriented InGaAs/GaAs quantum dots

Abstract: We use an sp 3 d 5 s * tight-binding model to investigate the electronic and optical properties of realistic site-controlled (111)-oriented InGaAs/GaAs quantum dots. Special attention is paid to the impact of random alloy fluctuations on key factors that determine the fine-structure splitting in these systems. Using a pure InAs/GaAs quantum dot as a reference system, we show that the combination of spin-orbit coupling and biaxial strain effects can lead to sizeable spin-splitting effects in these systems. Then… Show more

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Cited by 7 publications
(9 citation statements)
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References 78 publications
(101 reference statements)
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“…Note that eqs. (24)(25)(26)(27) are identical to the covalent equations (eqs. (17)(18)(19)(20)) apart from the electrostatic addi- tion; the non-Coulombic case can be recovered by setting S = 0.…”
Section: B Conventional Inclusion Of Coulomb Interactionmentioning
confidence: 97%
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“…Note that eqs. (24)(25)(26)(27) are identical to the covalent equations (eqs. (17)(18)(19)(20)) apart from the electrostatic addi- tion; the non-Coulombic case can be recovered by setting S = 0.…”
Section: B Conventional Inclusion Of Coulomb Interactionmentioning
confidence: 97%
“…Force constants and effective charge parameters for selected III-V materials obtained from eqs. (24)(25)(26)(27) are given in Table III.…”
Section: B Conventional Inclusion Of Coulomb Interactionmentioning
confidence: 99%
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“…The empirical tight-binding method with sp 3 d 5 s * basis in the nearest neighbor approximation gives a precise description of band structure of bulk III-V [13] and group IV [14] semiconductors. It has a long history of application for the nanostructures [15][16][17][18][19][20]. The parameters of the method may be in principle extracted from the DFT calculations [21][22][23] which makes this method an atomistic interpolation of underlying DFT model.…”
Section: Introductionmentioning
confidence: 99%