1952
DOI: 10.1021/ja01121a059
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The Vapor Pressures of Tellurium and Selenium

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Cited by 131 publications
(69 citation statements)
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“…However, the isotherm is very steep in this region and it is difficult to put a definite upper limit on the number of layers which one could obtain, but in no case were films thicker than 20 atoms observed. Furthermore, it may be said provisionally that we have not been able to obtain films thicker than 40 These results seem to contradict those of Kistemaker and of Long and Meyer, which yielded a film about 160 atoms thick near saturation. Our results are in better agreement with those of Jackson and co-workers.…”
Section: Discussioncontrasting
confidence: 55%
“…However, the isotherm is very steep in this region and it is difficult to put a definite upper limit on the number of layers which one could obtain, but in no case were films thicker than 20 atoms observed. Furthermore, it may be said provisionally that we have not been able to obtain films thicker than 40 These results seem to contradict those of Kistemaker and of Long and Meyer, which yielded a film about 160 atoms thick near saturation. Our results are in better agreement with those of Jackson and co-workers.…”
Section: Discussioncontrasting
confidence: 55%
“…[8] Above about 847 K this equation and that of Brooks [10] agree to within about 2%. Below 847 K Eq 4 gives values increasingly lower than Brooks', reaching about 15% at the melting point.…”
Section: Thermodynamic Properties Of Telluriummentioning
confidence: 77%
“…This model assumes that the S and Se incorporation in CIGSS is controlled by the kinetics of chemisorption of the chalcogen species and incorporation into the chalcopyrite lattice. This is justified by the following observations: (i) the evaporation pressure of S [11] and Se [12] is much greater than the vacuum during film growth so that the incorporation of S and Se into the film is controlled by its reaction with Cu, In, and Ga; (ii) since the reaction temperature is more than 300°C below the melting temperature of the four extremes of ternary chalcopyrites [13,14,15,16,17] the driving force to form the chalcopyrite phase from the vapor is sufficient with either S or Se [ 18,19,20]; and (iii) the growth rate is controlled by the fluxes of Cu, In, and Ga, and the relative compositions of the groups I and III species in the films match those of the fluxes. The solid lines in Figure 1 fitting the data for CIGSS samples were determined from the following simple equation derived from the kinetic model for chalcogen incorporation [10].…”
Section: Results: Uniform Depositionmentioning
confidence: 99%