The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium

Ungár, Tamás; Glavicic, M.G.; Balogh, Levente; Nyilas, K.; Salem, Ayman A.; Ribárik, Gabor; Semiatin, S. L.

doi:10.1016/j.msea.2007.06.096

Cited by 42 publications

(17 citation statements)

References 18 publications

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“…It is noted here that, these selection rules are in qualitative correlation with the selection rules worked out by Warren [1]. Based on the analysis of the numerically calculated diffraction patterns of faulted and twinned fcc [51] and hexagonal [88,89] crystals, Lorentzian and delta-function like profile functions are considered as the uniform profile functions corresponding to faulting and twinning. The hkl scaling of breadths and shifts of these uniform profile functions was determined numerically as a function of the density of planar defects, by using the DIFFaX software [42], and is given in data sheets of polinomials available at: http://metal.elte.hu/~le-vente/stacking.…”

Section: Incorporation Of Planar Defectssupporting

confidence: 52%

“…In crystals with planar faults the determination of uniform profile functions has recently been done for fcc [51, 85, Defect structures by X-ray line profile analysis 86] and hexgonal crystals [88,89]. There are three types of planar faults: intrinsic, extrinsic stacking faults and twins.…”

Section: Incorporation Of Planar Defectsmentioning

confidence: 99%

“…The resultant profile (solid line) is asymmetrically broadened and has a delta function like component. In [51,88,89] it was shown that the sub-reflections, apart from the delta-function like components, are Lorentzian functions as far as 10 À4 relative intensities down into their tails. In [51] it was shown that peak broadening caused by faulting does not increase with diffraction order.…”

Section: Incorporation Of Planar Defectsmentioning

confidence: 99%

See 2 more Smart Citations

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Gubicza

Ungár

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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Abstract. X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials.

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Section: Incorporation Of Planar Defectssupporting

confidence: 52%

Section: Incorporation Of Planar Defectsmentioning

confidence: 99%

Section: Incorporation Of Planar Defectsmentioning

confidence: 99%

See 1 more Smart Citation

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Gubicza

Ungár

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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“…Strong contrast variations are evident between the grains because the different orientations result in large differences in channelling behaviour. With deformation, as dislocations accumulate within grains, typically to the order of 10 2 mm −2 when plastic strain is about 5 per cent (Crimp et al 2004;Ungar et al 2008), significant lattice distortions are generated and stronger contrast variations develop within the grains. Consequently, the grain-to-grain contrast becomes less dominant with deformation, whereas the intra-grain contrast increases.…”

Section: Introductionmentioning

confidence: 99%

Quantitative measurement of plastic strain field at a fatigue crack tip

et al. 2012

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A novel approach is introduced to map the mesoscale plastic strain distribution resulting from heterogeneous plastic deformation in complex loading and component geometries, by applying the discrete Fourier transform (DFT) to backscattered electron (BSE) images of polycrystalline patches. These DFTs are then calibrated against the full width at half the maximum of the central peak of the DFTs collected from the same material tested under in situ scanning electron microscopy uniaxial tensile conditions, which indicates a close relationship with the global tensile strain. In this work, the technique is demonstrated by measuring the residual strain distribution and plastic zone size around a fatigue crack tip in a commercially pure titanium compact tension specimen, by collecting BSE images in a 15 × 15 array of 115 mm square images around the fatigue crack tip. The measurement results show good agreement with the plastic zone size and shape measured using thermoelastic stress analysis.

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“…The measurement of microstructural details in hexagonal crystals is more difficult than in cubic crystals because of the complexity of their crystal structures. The multiple whole-profile (MWP) fitting procedure 2) is the principal analysis method for measuring microstructural details in hexagonal crystals, such as Mg, 3,4) Ti 5,6) and Zr. 7) However, the principle of the procedure is complicated, and also the results depend strongly on the input data with arbitrary properties.…”

Section: Introductionmentioning

confidence: 99%

Evaluation of Dislocation Density in a Mg-Al-Mn-Ca Alloy Determined by X-ray Diffractometry and Transmission Electron Microscopy

et al. 2010

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Metallic materials suffering deformation store elastic strain. Evaluation of this strain energy is important for understanding the mechanical and physical properties of the materials. Although direct evaluation of the stored energy is difficult, it can be evaluated by determining the defect energy of dislocations induced by the deformation. Thus, a practicable method of evaluating the strain energy is to measure the dislocation density in metallic materials. The average and representative dislocation density can be estimated by X-ray diffraction (XRD) analysis. We have estimated the dislocation density of a magnesium alloy with hexagonal crystals by a modified Warren-Averbach analysis based on a modified Williamson-Hall plot using XRD profiles. The dislocation density value obtained by this method agrees with those reported previously. We found that the modified Warren-Averbach method is still a powerful method for evaluating the dislocation density in hexagonal crystals.

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The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium

Cited by 42 publications

References 18 publications

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

Quantitative measurement of plastic strain field at a fatigue crack tip

Evaluation of Dislocation Density in a Mg-Al-Mn-Ca Alloy Determined by X-ray Diffractometry and Transmission Electron Microscopy

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