The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films

Lamberti, Carlo

doi:10.1016/j.surfrep.2003.12.001

Cited by 99 publications

(28 citation statements)

References 918 publications

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“…This makes extended X-ray absorption fine structure (EXAFS) an atomically selective technique that provides information on the selected atom only [83]. In the studies of the local environment of highly diluted species [84][85][86], this is a great advantage of EXAFS with respect to scattering techniques, where all atoms present in the sample contribute to the signal.…”

Section: X-ray Transient Absorption: Theoretical Background and Expermentioning

confidence: 99%

Synchrotron ultrafast techniques for photoactive transition metal complexes

Borfecchia

Garino

Salassa

et al. 2013

Phil. Trans. R. Soc. A.

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In the last decade, the use of time-resolved X-ray techniques has revealed the structure of lightgenerated transient species for a wide range of samples, from small organic molecules to proteins. Time resolutions of the order of 100 ps are typically reached, allowing one to monitor thermally equilibrated excited states and capture their structure as a function of time. This review aims at providing a general overview of the application of timeresolved X-ray solution scattering (TR-XSS) and time-resolved X-ray absorption spectroscopy (TR-XAS), the two techniques prevalently employed in the investigation of light-triggered structural changes of transition metal complexes. In particular, we herein describe the fundamental physical principles for static XSS and XAS and illustrate the theory of timeresolved XSS and XAS together with data acquisition and analysis strategies. Selected pioneering examples of photoactive transition metal complexes studied by TR-XSS and TR-XAS are discussed in depth.

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Section: X-ray Transient Absorption: Theoretical Background and Expermentioning

confidence: 99%

Synchrotron ultrafast techniques for photoactive transition metal complexes

Borfecchia

Garino

Salassa

et al. 2013

Phil. Trans. R. Soc. A.

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“…Much attention has been also paid to the electronic and magnetic properties of the ultra-thin films dependent on the thickness and substrate materials. [11][12][13][14] In the latter case, an electronic charge transfer which induces an interface dipole plays a crucial role. 15 There are many reports on the interface structure of NiO(001)/Ag(001), which were analyzed by tensor low energy electron diffraction (LEED) analysis 16,17 and by extended X-ray absorption fine structure (EX-AFS) technique.…”

Section: Introductionmentioning

confidence: 99%

The atomic and electronic structures of NiO(001)/Au(001) interfaces

Visikovskiy

Mitsuhara

Hazama

et al. 2013

The Journal of Chemical Physics

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The atomic and electronic structures of NiO(001)∕Au(001) interfaces were analyzed by high-resolution medium energy ion scattering (MEIS) and photoelectron spectroscopy using synchrotron-radiation-light. The MEIS analysis clearly showed that O atoms were located above Au atoms at the interface and the inter-planar distance of NiO(001)∕Au(001) was derived to be 2.30 ± 0.05 Å, which was consistent with the calculations based on the density functional theory (DFT). We measured the valence band spectra and found metallic features for the NiO thickness up to 3 monolayer (ML). Relevant to the metallic features, electron energy loss analysis revealed that the bandgap for NiO(001)∕Au(001) reduced with decreasing the NiO thickness from 10 down to 5 ML. We also observed Au 4f lines consisting of surface, bulk, and interface components and found a significant electronic charge transfer from Au(001) to NiO(001). The present DFT calculations demonstrated the presence of an image charge beneath Ni atoms at the interface just like alkali-halide∕metal interface, which may be a key issue to explain the core level shift and band structure.

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“…Their weak interaction with matter allows for a nondestructive in situ investigation, making x-ray techniques complementary to invasive electron microscopy methods. They are particularly relevant in nanosciences [2], where detailed knowledge of the internal structure on the nanoscale is fundamental to understand and monitor the nanostructure's physical properties [3]. However, the impossibility to measure the phase of the diffracted beams, known as the ''phase problem,'' is a strong limitation.…”

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confidence: 99%