Abstract:For composite systems where the matrix is electrically conductive, the possibility that the nature of electrical current flow in the composite can be used to detect defects such as out‐of‐plane delamination. Melt‐infiltrated SiC‐based composites are an ideal candidate material for such to verify this since the Si content of the matrix is the primary current carrier in the system. Two different potential drop techniques utilizing the four‐point probe method were developed on a composite panel that had a large p… Show more
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