The uniformity properties of diode structure field emission display matrix

Ren, Haizhen; Deng, S.Z.; Ns, Xu

doi:10.1109/ivmc.2003.1223092

IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479)

DOI: 10.1109/ivmc.2003.1223092

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The uniformity properties of diode structure field emission display matrix

Haizhen Ren¹,

S.Z. Deng²,

Xu Ns³

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The uniformity properties of diode structure field emission display matrix

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