The Theory of Dynamical X‐Ray Diffraction on a Superlattice

Khapachev, Yu. P.

doi:10.1002/pssb.2221200117

Cited by 11 publications

(22 citation statements)

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“…In the framework of the assumptions done by (3.2), (3.3) and following the t,heory of [8] 1/1 + 16f2 IXHl2 q2 + 4 2 -f2k2 + b2/2) .…”

Section: Tk =mentioning

confidence: 99%

“…As shown in [8] for superlattices (SL) in which the interplane distances and structural factors vary harmonically, the widths of the first-order satellites are not equal to each other and depend on the structural parameters of SL, viz. on the value of the discrepancy / 3 = Aala and on the relative variation of the structural factor (x = AFfP.…”

Section: Definition O! Strains In the Layers Of A Superlatticementioning

confidence: 99%

“…In [8] the general theory of diffraction in a multi-layer periodic crystal is given. According to it, the shape of the curve of diffractional reflection (widths of the satellites, their spacing, etc.)…”

Section: Introductionmentioning

confidence: 99%

“…I n this paper we use the approach Qf [8] for the analysis of elastic strains in heteroepitaxial superlattices. The purpose of this work is to demonstrate the possibility to analyze the elastic-stress states for two-and multi-layer and periodic heterostructures by the method of non-destructive X-ray diffractometry.…”

Section: Introductionmentioning

confidence: 99%

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The Theory of X‐Ray Diffraction Analysis of Elastic‐Strain States in Epitaxial Films

Khapachev

Dyshekov

Kiselev

1984

Physica Status Solidi (b)

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“…In the framework of the assumptions done by (3.2), (3.3) and following the t,heory of [8] 1/1 + 16f2 IXHl2 q2 + 4 2 -f2k2 + b2/2) .…”

Section: Tk =mentioning

confidence: 99%

Section: Definition O! Strains In the Layers Of A Superlatticementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

The Theory of X‐Ray Diffraction Analysis of Elastic‐Strain States in Epitaxial Films

Khapachev

Dyshekov

Kiselev

1984

Physica Status Solidi (b)

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“…Such layer creates two-dimensional quantum wells. Fundamental problems of coherent X-ray optics of QDSL are very important together with the obvious practical consequence.In this paper the theory of X-ray dynamical diffraction in SL [3][4][5] is spread on the rectangular SL with different layer thicknesses in a SL period. Therewith the thickness of one layer is much less than that of another one (see fig.…”

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confidence: 99%

X-ray dynamical diffraction on superlattice with unequal layer thicknesses

1997

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Summary. --The main peculiarities of the formation of the unified wave field under conditions of the X-ray dynamical diffraction in the rectangular superlattice (SL) with unequal layer thicknesses in a SL period are considered. The analysis is carried out on the stable and unstable solutions of Takagi system method. The particular case of SL with very large difference of layer thicknesses in a SL period is discussed specially. The obtained analytical expressions are compared with the rocking curve calculated by the help of the recurrent formula for SLs.PACS 61.10 -X-ray diffraction and scattering. PACS 01.30.Cc -Conference proceedings.The growth of semiconductor superlattices (SL) with ultimately thin layer thicknesses is a perspective direction of the modern optoelectronics. Principal new features of such objects have appeared in [1,2]. These features are related with the decrease of structure dimension and dimension quantization effects emerge. The semiconductor SL with ultimately thin thickness of one layer inside a SL period (quantum-dimensional SL--QDSL) is one of the variants of the SL possessing quantum-dimensional properties. Such layer creates two-dimensional quantum wells. Fundamental problems of coherent X-ray optics of QDSL are very important together with the obvious practical consequence.In this paper the theory of X-ray dynamical diffraction in SL [3][4][5] is spread on the rectangular SL with different layer thicknesses in a SL period. Therewith the thickness of one layer is much less than that of another one (see fig. la). The approach used assumes the existence of angular intervals of X-ray wave extinction damping and (*) Paper presented at the 3rd European Symposium on X-ray Topography and High-Resolution X-ray Diffraction (X-TOP '96), 22-24 April 1996, Palermo, Italy. 531

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Characterization of Ga1−xAlxAs/GaAs superlattices and thin single layers by X-ray diffraction

Baumbach

Brühl

Pietsch

et al. 1988

Phys. Stat. Sol. (a)

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The optimization of the production conditions of laser materials on the basis of multiquantum structures as an active layer, requires the knowledge of the geometrical structure, chemical composition, and the stress profile of the applied superlattice. These data can be established by the method of X-ray diffraction, since the periodic hyperstructure of the superlattice in the nanometer region has a detectable influence on the X-ray diffraction pattern. The characterization of superlattices by this technique is performed by the help of an X-ray collimator equipment. In principle i t represents a double crystal diffractometer with a slit monolithic Si-crystal, which is an almost ideal collimator and monochromator. A short theoretical consideration is given of the superlattice diffraction and first results. Additional first experimental results of X-ray diffraction measurements on single layer-structure are presented. ZurOptimierung der Herstellungsbedingungen von Laserstrukturen auf der Basis von Multiquantenwall-Strukturen (MQW's) als aktive Schicht, ist man auf Aussagen zur geometrischen Struktur, zur chemischen Zusammensetzung und zum Spannungsprofil der verwendeten Supergitter angewiesen. Diese Informationen vermag die Methode der Rontgenbeugung zu liefern, da die periodische oberstruktur des Supergitters im Nanometerbereich einen nachweisbaren EinfluD auf das Rontgenbeugungsbild hat. Die Charakterisierung von Supergittern mit Hilfe der Rontgenbeugung erfolgte mit einer Rontgenkollimatoranlage. Diese stellt vom Prinzip her ein Doppelkristalldiffraktometer mit einem geschlitzten monolithischen Silizium-Kristall als nahezu idealen Kollimator und Monochromator dar. Es folgt eine theoretische Betrachtung zur Beugung an einem Supergitter und die Darstellung von ersten Ergebnissen. Erste experimentelle Untersuchungen an einer Einschicht-Struktur werden vorgestellt. l) LinnBstr. 5, Leipzig 7010, GDR. 2, Nishinomiya, Japan.

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The Theory of Dynamical X‐Ray Diffraction on a Superlattice

Cited by 11 publications

References 11 publications

The Theory of X‐Ray Diffraction Analysis of Elastic‐Strain States in Epitaxial Films

The Theory of X‐Ray Diffraction Analysis of Elastic‐Strain States in Epitaxial Films

X-ray dynamical diffraction on superlattice with unequal layer thicknesses

Characterization of Ga1−xAlxAs/GaAs superlattices and thin single layers by X-ray diffraction

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