1972
DOI: 10.1016/0038-1101(72)90028-7
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The temperature variation of the electron diffusion length and the internal quantum efficiency in GaAs electroluminescent diodes

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Cited by 7 publications
(2 citation statements)
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“…A formalism as described above has been used to extract values of the diffusion length Le from relative emission data [5]. …”
Section: The Integration Of Equation (8a) For the Distribution In (5bmentioning
confidence: 99%
“…A formalism as described above has been used to extract values of the diffusion length Le from relative emission data [5]. …”
Section: The Integration Of Equation (8a) For the Distribution In (5bmentioning
confidence: 99%
“…The emitted light is dependent on the quasi-Fermi level (qFl) splitting, the depth profile of which will reflect the collection issues 8 . Therefore, under different external condition (illumination and applied voltage), the depth of emission will be modified, leading to a luminescence spectral variation 9,10 . The depth emission can modify the monitored spectra due to, for example, re-absorption on the light path to the surface or slight depth variation of the material absorptivity.…”
Section: Introductionmentioning
confidence: 99%