Abstract:The structure of the films of poly(1-trimethylsilyl-1-propyne) (PTMSP) with different configurational compositions (the concentration of cis-units of 40 to 80%) is analyzed in this study. The combination of X-ray diffraction analysis and atomic force microscopy makes it possible to reveal the peculiarities of the supramolecular organization and morphology of PTMSP films. The diffraction patterns of PTMSP films indicate an increase in the ordering of the supramolecular organization in the case of an increase in… Show more
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