2017 International Conference on Intelligent Communication and Computational Techniques (ICCT) 2017
DOI: 10.1109/intelcct.2017.8324022
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The super-diode-DRAM (SD-DRAM) — A comparative approach for CMOS memory cell to obtain low power consumption and read/write access time

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Cited by 2 publications
(3 citation statements)
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“…In addition, we have calculated the energy consumption of our proposed skyrmion-based diode. The power consumption of CMOS diodes with different designing styles is approximately 0.01-0.136 pJ [45], while for the skyrmion diodes, the power consumption is estimated to be 0.007 pJ, which is less than that of the CMOS diodes. For the analysis of power consumption of the skyrmion-based diodes, please refer to the supplementary material for details.…”
Section: Resultsmentioning
confidence: 94%
“…In addition, we have calculated the energy consumption of our proposed skyrmion-based diode. The power consumption of CMOS diodes with different designing styles is approximately 0.01-0.136 pJ [45], while for the skyrmion diodes, the power consumption is estimated to be 0.007 pJ, which is less than that of the CMOS diodes. For the analysis of power consumption of the skyrmion-based diodes, please refer to the supplementary material for details.…”
Section: Resultsmentioning
confidence: 94%
“…The other two transistors are used for the reading stage, where one transistor permits the flow of current to perform the reading. In comparison, the second transistor positioned between the two previous transistors retains the bit to be saved through parasitic capacitances [3][4][5][6][7][8][9]. These last elements are known as the reading transistor and the storage transistor, respectively.…”
Section: Logic and Stagesmentioning
confidence: 99%
“…The extant literature shows that the 3-transistor (3T) topology consumes less power and shows lower delay values when compared to other topologies [5]; however, it is of interest to know the impact of the dimensions of the in-cell transistors on the memory performance. Therefore, this work will evaluate the electrical performance during the writing and reading stages of 8-bit eDRAM devices by varying the aspect ratio of the transistors within the cell.…”
Section: Introductionmentioning
confidence: 99%