2008 3rd IEEE Conference on Industrial Electronics and Applications 2008
DOI: 10.1109/iciea.2008.4582712
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The study of TE process based on the improved PCA method

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“…(1) Logistic Regression (LR) [2] (2) Support Vector Machine (SVM) [1] (3) Cross-Domain Spectral Classification (CDSC) [35] (4) Transfer Component Analysis (TCA) [36] (5) Deep Domain Confusion (DDC) [34] (6) Domain Adversarial Neural Network (DANN) [37] LR and SVM are the classical conventional supervised classification approaches, which have been successfully applied for fault diagnosis. CDSC and TCA are both effective methods based on transfer subspace learning proposed for fault diagnosis issues, especially, TCA is the representative technique by searching the feature subspace in the domain adaptation field.…”
Section: B Compared Methodsmentioning
confidence: 99%
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“…(1) Logistic Regression (LR) [2] (2) Support Vector Machine (SVM) [1] (3) Cross-Domain Spectral Classification (CDSC) [35] (4) Transfer Component Analysis (TCA) [36] (5) Deep Domain Confusion (DDC) [34] (6) Domain Adversarial Neural Network (DANN) [37] LR and SVM are the classical conventional supervised classification approaches, which have been successfully applied for fault diagnosis. CDSC and TCA are both effective methods based on transfer subspace learning proposed for fault diagnosis issues, especially, TCA is the representative technique by searching the feature subspace in the domain adaptation field.…”
Section: B Compared Methodsmentioning
confidence: 99%
“…Based on the actual chemical reaction process, TE process was created on an open and challenging chemical model simulation platform, whose purpose is to provide a realistic industrial process for evaluating process control and monitoring methods [34]. As a data source for comparing various methods, TE datasets has been widely used in research such as control optimization, process monitoring and fault diagnosis.…”
Section: ) Te Process Datamentioning
confidence: 99%