The structure of Na2O–Al2O3–SiO2 glass: impact on sodium ion exchange in H2O and D2O

McGrail, B. Peter; Icenhower, Jonathan P.; Shuh, David K.; Liu, P.; Darab, John G.; Baer, Donald R.; Thevuthasen, S; Shutthanandan, V.; Engelhard, Mark H.; Booth, C. H.; Nachimuthu, Ponnusamy

doi:10.1016/s0022-3093(01)00890-0

Cited by 152 publications

(161 citation statements)

References 37 publications

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“…This behavior would apparently contradict the proposal of Grambow [22] in which the activity of silicic acid alone is assumed to control the dissolution rate of borosilicate glass. However, McGrail et al [25] argue that the non-linear behavior can be attributed to a secondary reaction mechanism, alkali ion exchange. Under dilute solution conditions (low silicic acid activities), sodium and boron rates are identical within experimental error, as can be seen in Figures 6 and 7.…”

Section: Solutions Doped With Simentioning

confidence: 99%

Waste Form Release Data Package for the 2001 Immobilized Low-Activity Waste Performance Assessment

McGrail¹,

Icenhower²,

Martin³

et al. 2001

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SUMMARYThis data package documents the experimentally derived input data on the representative waste glasses LAWABP1 and HLP-31 that will be used for simulations of the immobilized lowactivity waste disposal system with the Subsurface Transport Over R eactive Multiphases (STORM) code. The STORM code will be used to provide the near-field radionuclide release source term for a performance assessment to be issued in March of 2001. Documented in this data package are data related to 1) kinetic rate law parameters for glass dissolution, 2) alkali-H ion exchange rate, 3) chemical reaction network of secondary phases that form in accelerated weathering tests, and 4) thermodynamic equilibrium constants assigned to these secondary phases. The kinetic rate law and Na + -H + ion exchange rate were determined from single-pass flow-through experiments. Pressurized unsaturated flow and vapor hydration experiments were used for accelerated weathering or aging of the glasses. The majority of the thermodynamic data were extracted from the thermodynamic database package shipped with the geochemical code EQ3/6. However, several secondary reaction products identified from laboratory tests with prototypical LAW glasses were not included in this database, nor are the thermo dynamic data available in the open literature. One of these phases, herschelite, was determined to have a potentially significant impact on the release calculations and so a solubility product was estimated using a polymer structure model developed for zeolites.Although this data package is relatively complete, final selection of ILAW glass compositions has not been done by the waste treatment plant contractor. Consequently, revisions to this data package to address new ILAW glass formulations are to be regularly expected.v CONTENTS

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Section: Solutions Doped With Simentioning

confidence: 99%

Waste Form Release Data Package for the 2001 Immobilized Low-Activity Waste Performance Assessment

McGrail¹,

Icenhower²,

Martin³

et al. 2001

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“…As a comparison, interlaced and noninterlaced mode using 2.0 keV O 2 + sputtering show~6 times difference in mass resolution and~560 times difference in signal intensity for the 28 Si + signal. Interlaced and noninterlaced mode using 2.0 keV Cs + sputtering show~7 times difference in mass resolution and~30 times difference in signal intensity for the 18 …”

Section: LImentioning

confidence: 99%

“…This advantage is especially important for deep depth profiling (e.g., ≥3 μm) because the measurement time is very long if Cs + or O 2 + sputtering is used. In Table 2, the signal intensity and mass resolution of the 28 Si + or 18 O -peak with non-interlaced mode 20 keV Ar n + sputtering is only slightly (5%-15%) better than that from interlaced mode. This means that with interlaced mode 20 keV Ar n + sputtering, the charge compensation is very effective, though it may not be as good as that with noninterlaced mode.…”

Section: LImentioning

confidence: 99%

“…A leached simulated borosilicate nuclear waste glass(SON68), a La 0.93 Sr 0.07 CrO 3 thin film on a SrTiO 3 substrate, and a SrTiO 3 /SrCrO 3 bilayer film on a SrTiO 3 substrate were selected as model systems for our study because of their fundamental and practical importance [16][17][18][19][20][21][22][23][24][25][26].…”

mentioning

confidence: 99%

“…This sample was prepared by growing a 50 nm SrCrO 3 thin film and then a 50 nm SrTiO 3 thin film on SrTiO 3 substrate (SrTiO 3 /SrCrO 3 /SrTiO 3 ) in 18 O 2 atmosphere, and 18 O is found to be diffused into the SrTiO 3 substrate with a significant depth (~10 μm as shown in Figure 5a). An Ar n + sputtering beam (20 keV Figure 5b.…”

mentioning

confidence: 99%

See 2 more Smart Citations

Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information

Wang

Liu

Zhao

et al. 2015

J. Am. Soc. Mass Spectrom.

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Abstract. The use of an argon cluster ion sputtering source has been demonstrated to perform superiorly relative to traditional oxygen and cesium ion sputtering sources for ToF-SIMS depth profiling of insulating materials. The superior performance has been attributed to effective alleviation of surface charging. A simulated nuclear waste glass (SON68) and layered hole-perovskite oxide thin films were selected as model systems because of their fundamental and practical significance. Our results show that high sputter rates and accurate interfacial information can be achieved simultaneously for argon cluster sputtering, whereas this is not the case for cesium and oxygen sputtering. Therefore, the implementation of an argon cluster sputtering source can significantly improve the analysis efficiency of insulating materials and, thus, can expand its applications to the study of glass corrosion, perovskite oxide thin film characterization, and many other systems of interest.

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Glass Durability Correlations Interpreted Through the Electronegativity and Basicity of Network Formers

Reynolds¹

2006

Ceramic Transactions Series

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The structure of Na2O–Al2O3–SiO2 glass: impact on sodium ion exchange in H2O and D2O

Cited by 152 publications

References 37 publications

Waste Form Release Data Package for the 2001 Immobilized Low-Activity Waste Performance Assessment

Waste Form Release Data Package for the 2001 Immobilized Low-Activity Waste Performance Assessment

Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information

Glass Durability Correlations Interpreted Through the Electronegativity and Basicity of Network Formers

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