1971
DOI: 10.1088/0022-3727/4/12/333
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The structure and crystal growth of nickel electrodeposits from a sulphamate bath on polished polycrystalline copper, in relation to thickness, rate of deposition, temperature and stirring

Abstract: Grazing-incidence electron diffraction shows the structure and growth of face-centred cubic (fcc) Ni electrodeposits from a sulphamate bath on polished polycrystalline Cu, at 50 and 20°C, both with and without stirring, at current density (cd) i up to 600 mA cm−2 at 50°C, and thickness H up to 60 000 Å or more.Seven isostructural regions of i and H are distinguished, with boundaries approximately of the form H(i-i0)=constant. The effects of bath temperature and of stirring are shown in detail. Ni(OH)2 is co-de… Show more

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Cited by 13 publications
(12 citation statements)
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“…All of them have been discussed in detail previously. 6 The pyramidtype Cu deposits were observed on (100) Cu and (111) Cu single-crystal substrates at low current densities. The side faces of the pyramids did not correspond to the low-index crystallographic planes but originated from the stacking of the pyramidal base planes presumably as a result of the spiral growth around threading screw dislocations.…”
Section: Discussionmentioning
confidence: 98%
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“…All of them have been discussed in detail previously. 6 The pyramidtype Cu deposits were observed on (100) Cu and (111) Cu single-crystal substrates at low current densities. The side faces of the pyramids did not correspond to the low-index crystallographic planes but originated from the stacking of the pyramidal base planes presumably as a result of the spiral growth around threading screw dislocations.…”
Section: Discussionmentioning
confidence: 98%
“…As displayed in Fig. 7b, new grains of various orientations had nucleated on top of the (133)[32-3] epilayer and the (131) [3][4][5][6][7][8][9][10] grains on grain 2 upon subsequent deposition. Some of the grains among them had <100>∼//ND orientations and could, therefore, grow rapidly into columnar shapes.…”
Section: Cross-section Ebsd Analyses Of Deposited Films-cross-sectionmentioning
confidence: 99%
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