1977
DOI: 10.1107/s0567739477000977
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The structure and Bijvoet ratios of cadmium selenide

Abstract: The structure of cadmium selenide has been determined from X-ray intensity data obtained with extendedface crystals. The wurtzite parameter u was found to be 0.37679_ 0.00012. Comparison of the intensities of equivalent reflexions provided a test for the internal consistency of the measurements. Equivalent reflexions in two specimens differed on average by 1.4 and 0"6% from the mean measured intensity, attesting to the high internal consistency of measurements from extended-face crystals. Comparison of 36 stru… Show more

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Cited by 31 publications
(28 citation statements)
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“…Cromer, Larson & Roof (1964) for UMoC2. Attempts were also made to refine the dispersion corrections from observed Bijvoet ratios (Zachariasen, 1965;Freeman, Mair & Barnea, 1977). Large correlations precluded the simultaneous refinement of all four dispersion corrections, but the corrections for either atomic species could be ascertained separately (Freeman, Mair & Barnea, 1977) and showed approximate agreement with the values of Cromer & Liberman (1970) in the case of the imaginary corrections.…”
Section: Resultsmentioning
confidence: 99%
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“…Cromer, Larson & Roof (1964) for UMoC2. Attempts were also made to refine the dispersion corrections from observed Bijvoet ratios (Zachariasen, 1965;Freeman, Mair & Barnea, 1977). Large correlations precluded the simultaneous refinement of all four dispersion corrections, but the corrections for either atomic species could be ascertained separately (Freeman, Mair & Barnea, 1977) and showed approximate agreement with the values of Cromer & Liberman (1970) in the case of the imaginary corrections.…”
Section: Resultsmentioning
confidence: 99%
“…Attempts were also made to refine the dispersion corrections from observed Bijvoet ratios (Zachariasen, 1965;Freeman, Mair & Barnea, 1977). Large correlations precluded the simultaneous refinement of all four dispersion corrections, but the corrections for either atomic species could be ascertained separately (Freeman, Mair & Barnea, 1977) and showed approximate agreement with the values of Cromer & Liberman (1970) in the case of the imaginary corrections. The refined values of the real dispersion corrections, however, showed large discrepancies with those of Cromer & Liberman (1970), highlighting the extreme sensitivity of these quantities to the quality of the data.…”
Section: Resultsmentioning
confidence: 99%
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“…Direct experimental determinations off" have been carried out only for a few atoms (see Table 1) by careful measurements of selected Bijvoet differences. The availability of synchrotron radiation of tunable wavelengths has led to accurate determinations off" (Phillips, Templeton, Templeton & Hodgson, 1978 Zachariasen (1965); (e) recalculated by Engel (1972); (f) 13 3 4 present work; (g) Parthasarathy (1962); (h) Templeton, Zalkin, Ruben & Templeton (1979); (i) see (h); (j) Engel & Sturm (1975); (k) Marezio (1965a); (l) Marezio, Tranqui & Capponi (1975); (m) Freeman, Mair & Barnea (1977); (n) Hall & Maslen (1966); (o) . Using a GEXRD-3 diffractometer equipped with Ross filters and a full to circle, the integrated intensities for a set of hkl, hkl and hkl, hkl reflections were collected.…”
Section: Introductionmentioning
confidence: 99%
“…The fact that the to and 20 circles are uncoupled enables us to collect data at asymmetric settings. [The symmetric settings of a given Bragg reflection corresponding to the azimuthal angle to being 0 or 180 °, where we refer to extendedface crystal geometry (Mair, Prager & Barnea, 1971a, b;Freeman, Mair & Barnea, 1977) and align the sample normal to be accurately parallel to the diffractometer ~o axis.] In this paper we will utilize this capability of the four-circle diffractometer to collect accurate X-ray integrated intensities as a function of tO, for a number of semiconductor substrate materials and epitaxic layers.…”
mentioning
confidence: 99%