1996
DOI: 10.1007/bf02655377
|View full text |Cite
|
Sign up to set email alerts
|

The structural, optical, and electrical properties of vacuum evaporated Cu-doped ZnTe polycrystalline thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
18
0

Year Published

1997
1997
2023
2023

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 35 publications
(19 citation statements)
references
References 11 publications
1
18
0
Order By: Relevance
“…The material of the back contact for CdTe has been investigated and applied, such as ZnTe, ZnTe/ZnTe:Cu. [3][4][5] Copper(Cu) has been found to be an acceptor dopant for CdTe film and is widely used in high-efficiency CdTe solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…The material of the back contact for CdTe has been investigated and applied, such as ZnTe, ZnTe/ZnTe:Cu. [3][4][5] Copper(Cu) has been found to be an acceptor dopant for CdTe film and is widely used in high-efficiency CdTe solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, stress which is believed to be the major cause of nanorods origin is excluded. Similarly, no cracks were observed since the films were of good crystallinity, so in our case intrinsic stress did not play a significant role, contrary to other evaporation methods [14].…”
Section: Surface Morphologymentioning
confidence: 44%
“…The history of Bi nanorods fabrication is dated 20 years ago [14]. The first such structures had a diameter in the range of microns while in the later ones, a diameter of 200 nm was achieved by high pressure casting.…”
Section: Introductionmentioning
confidence: 99%
“…The series resistance obtained from cells with a ZnTe layer is less than 0.1 Q cm 2 , much smaller than that obtained without a ZnTe layer. Because the doping concentration of ZnTe is over 10 2 0 cm-3 [19], the contact between the final metal contact and ZnTe is not expected to depend critically on the work function of the metals. Indeed, the lowest series resistances we obtained with Ni-, Au-and Co-contacted cells are very similar.…”
Section: Optimization Of the Znte:cu Layer And Its Processing Conditionsmentioning
confidence: 99%
“…We have also investigated higher annealing temperatures. However, cells with good efficiencies were only obtainable at annealing temperatures below 200°C, even though ZnTe films with improved electrical and structural properties can be obtained at higher annealing temperatures [19]. This is possibly caused by degradation of the CdTe/CdS junction or reactions between CdTe and ZnTe at high annealing temperatures.…”
mentioning
confidence: 99%