“…For the virgin samples, the value of a as-deposited ¼ 6:485 ( A which is larger than the powder (free of stress) sample a powder ¼ 6:481 ( A, and this suggests that the film is submitted to a compressive stress in the plane parallel to the substrate surface. In the case of annealed sample, the lattice parameter a treated ¼ 6:479 ( A, and similar results are reported in the literature [2][3][4][5][6]. The error in our estimation of the lattice parameter is 70.003 ( A.…”