The spatial origin of the spin-polarization of secondary-electron emission from Fe

Oliver, Paul; Toscano, S.; Totland, K.; Landolt, M.

doi:10.1016/0039-6028(91)90947-q

Cited by 20 publications

(4 citation statements)

References 10 publications

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“…The value of the spin polarization is slightly higher for the excitation with grazingly scattered protons compared to the excitation with electrons, where the spin polarization of 20-30 eV secondary electrons is close to the mean polarization of 27% for conduction electrons in bulk Fe [20,[34][35][36]. The pronounced structure in the spin polarization k-th Layer at electron energies around 12 eV was also observed previously [34,35,37] and attributed to the spin-dependent band structure above the vacuum level [38] or the crystallinity of the sample [20]. The enhancement of the spin polarization for electron energies below 5 eV is also known from previous SPLEED measurements of electroninduced [36,37] and proton-induced [33,37] electron emission.…”

Section: Magnetic Propertiesmentioning

confidence: 82%

Spin polarization, structure and chemical composition of the Rh/Fe(100) interface

2005

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Section: Magnetic Propertiesmentioning

confidence: 82%

Spin polarization, structure and chemical composition of the Rh/Fe(100) interface

2005

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“…With some notable exceptions [52,[125][126][127][128][129], the information reported by the lowenergy photoelectrons imaged in PEEM primarily originates from within a nanometer of the sample surface [53]. In this zone, optical interactions dominate the electron environment.…”

Section: Photonics 6 Photoemission and Photonicsmentioning

confidence: 99%

Aberration Corrected Photoemission Electron Microscopy with Photonics Applications

Fitzgerald¹

2000

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Photoemission electron microscopy (PEEM) uses photoelectrons excited from material surfaces by incident photons to probe the interaction of light with surfaces with nanometer-scale resolution. The point resolution of PEEM images is strongly limited by spherical and chromatic aberration. Image aberrations primarily originate from the acceleration of photoelectrons and imaging with the objective lens and vary strongly in magnitude with specimen emission characteristics. Spherical and chromatic aberration can be corrected with an electrostatic mirror, and here I develop a triode mirror with hyperbolic geometry that has two adjacent, field-adjustable regions. I present analytic and numerical models of the mirror and show that the optical properties agree to within a few percent. When this mirror is coupled with an electron lens, it can provide a large dynamic range of correction and the coefficients of spherical and chromatic aberration can be varied independently. I report on efforts to realize a triode mirror corrector, including design, characterization, and alignment in our microscope at Portland State University (PSU). PEEM may be used to investigate optically active nanostructures, and we show that photoelectron emission yields can be identified with diffraction, surface plasmons, and dielectric waveguiding.Furthermore, we find that photoelectron micrographs of nanostructured metal and dielectric structures correlate with electromagnetic field calculations. We conclude that photoemission is highly spatially sensitive to the electromagnetic field intensity, allowing the direct visualization of the interaction of light with material surfaces at nanometer scales and over a wide range of incident light frequencies.ii

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“…The energy dependence of the electron transport in solids is a central issue for the understanding of electron spectroscopies [l] Inelastic electron-electron scattering is assumed to dominate the electron transport in solids and near the surface. In recent overlayer experiments the measurement of the spin polarization (SP) of the ejected secondary electrons has provided evidence of large deviations from the "universal curve" of the inelastic mean-free path at low electron kinetic energies, at least for ferromagnetic solids [2,3]. Furthermore clear evidence for a spin.…”

mentioning

confidence: 99%

“…Values of 3.7+-0.05 Afor the Fe SP attenuation through Cr [3] or Ta [2] were obtained in electron excited experiments in the approximation of identical secondary yield for substrate and overlayer. The clear advantage of our synchrotron radiation experiment is the chemical sensitivity which adds a constrain to the determination of the inelastic mean free path from overlayer data.…”

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confidence: 99%

Spin filtering effect on secondary electrons crossing an iron overlayer

1994

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Spin polarization (SP) measurements of the secondary electron yield from ferromagnetic interfaces is a sensitive probe of surface and interface magnetism. By exploiting the jumps of the total photoionization cross section in correspondence of the L-edge excitation in transition metals one introduces a chemical sensitivity in the SP via the enhancement of the secondary emission from a specific magnetic or non magnetic specie at the interface. The hv-dependence of the SP in overlayer experiments allows to derive accurately the total and spin-dependent attenuation lengths for secondary electrons in non-magnetic and ferromagnetic materials.

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The spatial origin of the spin-polarization of secondary-electron emission from Fe

Cited by 20 publications

References 10 publications

Spin polarization, structure and chemical composition of the Rh/Fe(100) interface

Spin polarization, structure and chemical composition of the Rh/Fe(100) interface

Aberration Corrected Photoemission Electron Microscopy with Photonics Applications

Spin filtering effect on secondary electrons crossing an iron overlayer

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