2000
DOI: 10.1016/s0009-2614(99)01250-6
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The size distribution, imaging and obstructing properties of C60 and higher fullerenes formed within arc-grown single walled carbon nanotubes

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Cited by 185 publications
(72 citation statements)
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“…It is well known that a signal at this position can be assigned to C 60 . We have made systematic studies of the pristine SWCNT samples and we have not been able to find any signs of C 60 in the raw samples which has been shown to be a possible "impurity" in arc discharge synthesized SWCNTs [43] (note the absence in the NMR spectrum of the empty SWCNTs). In contrast we have observed this signal in two adamantane filled Arc-SWCNT samples.…”
Section: Nuclear Magnetic Resonancementioning
confidence: 92%
“…It is well known that a signal at this position can be assigned to C 60 . We have made systematic studies of the pristine SWCNT samples and we have not been able to find any signs of C 60 in the raw samples which has been shown to be a possible "impurity" in arc discharge synthesized SWCNTs [43] (note the absence in the NMR spectrum of the empty SWCNTs). In contrast we have observed this signal in two adamantane filled Arc-SWCNT samples.…”
Section: Nuclear Magnetic Resonancementioning
confidence: 92%
“…In their simulated images the graphene layers and the concentric shells are easily recognizable. Fullerenes in the center of a single wall nanotube were also simulated (Sloan et al, 2000). The fullerenes are well observed in the center of the tube.…”
Section: Results Of Image Simulationsmentioning
confidence: 99%
“…For instance, Goel et al [71] reported a crystalline structure for C 60 in toluene with a diameter of about 0.7 nm, and a two-fold symmetry. Smith et al [72] and Sloan et al [73] reported HRTEM images of round closed shells of fullerenes with diameters smaller and larger than C 60 (0.4 to 1.6 nm) encapsulated within the hollow central region of individual single walled carbon nanotubes (SWCNTs) [72,73] and Burden and Hutchison [74] provided real-time evidence of C 60 and C 70 formation on the surface of carbon black particles irradiated with an electron beam. However, TEM produces a high level of sample perturbation because the grids must be dried prior to imaging and the particles are likely to aggregate to some degree.…”
Section: Characterisation Of Fullerenesmentioning
confidence: 99%