Materials Science in Semiconductor Processing
 2015
DOI: 10.1016/j.mssp.2015.02.047
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The significant effect of film thickness on the properties of chalcopyrite thin absorbing films deposited by RF magnetron sputtering

Pradeep Kumar Mishra
1
,
J.N. Prasad
2
,
V. Dave
3
et al.
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Cited by 6 publications
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