2014 20th International Conference on Microwaves, Radar and Wireless Communications (MIKON) 2014
DOI: 10.1109/mikon.2014.6899874
|View full text |Cite
|
Sign up to set email alerts
|

The SIE-MoM analysis of mixed vertical-horizontal metallization inside uniform waveguides and cavities

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2015
2015
2015
2015

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 9 publications
0
0
0
Order By: Relevance