The self-polarization effect in Pb(Zr0.50Ti0.50)O3 thin films with no preferential orientation

Lima, E. C.; Araújo, E. B.; Bdikin, Igor; Kholkin, A. L.

doi:10.1016/j.materresbull.2012.06.058

Cited by 19 publications

(12 citation statements)

References 14 publications

(21 reference statements)

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“…This result could be originated from the local highly preferential orientation, consistent with the result of TEM. Another most possible reason is the self‐poling effect frequently observed in PbTiO 3 and Pb(Zr,Ti)O 3 thin films by PFM, because of the existence of bottom electrode and defects in the films. However, for the in‐plane piezoresponse phase image, the distinct 180° contrast and the domain boundaries were exhibited, suggesting the existence of two different in‐plane components of spontaneous polarization directions.…”

Section: Resultsmentioning

confidence: 99%

Crystalline phase and electrical properties of lead‐free piezoelectric KNN‐based films with different orientations

et al. 2017

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Lead-free piezoelectric 0.915K 0.5 Na 0.5 NbO 3 -0.075BaZrO 3 -0.01Bi 0.5 Na 0.5 TiO 3 (KNN-BZ-BNT) films were grown on Nb-doped SrTiO 3 substrates with different orientations. The thin films show highly preferential orientations in accordance with the orientations of single crystalline substrates. The films all exhibit a weak contrast and remarkable homogeneity in the local static out-of-plane piezoresponse phase images, suggesting a strong self-polarization. Combining with the analysis of XRD-RSM, TEM and PFM, the crystalline phase of our samples was determined to be rhombohedral, which has the spontaneous polarization along[111] direction. Thus, the (100)-oriented film demonstrates the most superior piezoelectric properties. Our detailed studies on structural and electrical properties of KNN-BZ-BNT films further clarify the structure-property relationship and make a step closer to use this lead-free material for many piezoelectric applications.

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Section: Resultsmentioning

confidence: 99%

Crystalline phase and electrical properties of lead‐free piezoelectric KNN‐based films with different orientations

et al. 2017

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“…Recently, we observed a self-polarization effect [27,28] on polycrystalline randomly oriented PZT thin films prepared by a modified Pechini polymeric method [29]. Although structural, electrical and local piezoelectric properties of these films were investigated to infer about the origin of this self-polarization effect [30], the piezoelectric anisotropy in this film was not yet investigated by in situ XRD.…”

Section: Introductionmentioning

confidence: 99%

In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

et al. 2016

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International audiencePiezoelectric properties of randomly oriented self-polarized PbZr0.50Ti0.50O3 (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using microsized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d(33) was calculated in terms of the lab reference frame (d(perp)) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the d(perp) amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. (C) 2016 Elsevier B.V. All rights reserved

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“…Для понимания природы эффекта важным, но при этом малоизученным остается вопрос о причинах, приводящих к различной ориентации вектора униполярности. В экспериментах наблюдалось униполярное состояние, вектор которого был направлен как в сторону подложки [6][7][8][9][12][13][14][15]19,24,25], так и в противоположном направлении -к свободной поверхности тонкой пленки [1,5,7,11,12,20,22]. Предположения о причинах той или иной ориентации вектора по существу сводятся к двум основным физическим механизмам.…”

Section: Introductionunclassified

Влияние Высокотемпературного Отжига На Ориентацию Вектора Униполярности В Тонких Пленках Цирконата-Титаната Свинца

Канарейкин¹,

Каптелов²,

Сенкевич³

et al. 2016

Физика Твердого Тела

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Рассматриваются причины изменения ориентации вектора естественной униполярности в результате нагревания до температуры Кюри тонкопленочного конденсатора Pt/PZT/Pt (PZT-цирконат-титанат свинца), сформированного на подложке TiO 2 /SiO 2 /Si. Тонкие слои PZT, содержащие незначительный избыток оксида свинца, сформированы ex situ методом высокочастотного магнетронного распыления при вариации температуры отжига (кристаллизации фазы перовскита) в диапазоне 580−650 • C. Предполагается, что реориентация вектора униполярности в слое PZT вызвана сменой механизма кристаллизации фазы перовскита с ростом температуры отжига. Работа выполнена при частичной финансовой поддержке Министерства образования и науки РФ (грант 14.Z50.31.0034) и гранта РФФИ № 16-02-00632.

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The self-polarization effect in Pb(Zr0.50Ti0.50)O3 thin films with no preferential orientation

Cited by 19 publications

References 14 publications

Crystalline phase and electrical properties of lead‐free piezoelectric KNN‐based films with different orientations

Crystalline phase and electrical properties of lead‐free piezoelectric KNN‐based films with different orientations

In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

Влияние Высокотемпературного Отжига На Ориентацию Вектора Униполярности В Тонких Пленках Цирконата-Титаната Свинца

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