The scanning Kelvin microscope

Mäckel, Rainer; Baumgärtner, H.; Ren, Jie

doi:10.1063/1.1144200

Cited by 43 publications

(16 citation statements)

References 12 publications

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“…For controlling the distance various methods have been proposed: The Kelvin probes of Baumga¨rtner et al [20,21] and of Baikie et al [22] use the displacement current itself to keep the distance constant. In this way both instruments are able to register at the same time the local topography and the displacement current.…”

Section: Pacs: 6116c; 7330mentioning

confidence: 99%

Potentiometry with the acoustic near field microscope: A new method for microscopy of surface potentials

Steinke¹,

Hoffmann²,

Böhmisch³

et al. 1996

Applied Physics A: Materials Science & Processing

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Abstract. We used a quartz tuning fork vibrating at 30 kHz both as an acoustic near field microscope and at the same time as a microscopic Kelvin probe. One leg of the tuning fork carried a small gold electrode serving as a conducting vibrating tip. By using this instrument and the method described here it is possible to measure simultaneously both the surface topography of the sample surface and the contact potential between tip and sample. The topography is observed by operating the instrument as an acoustic near field microscope. The contact potential between the vibrating tip and the sample gives rise to a displacement current which is used here for the determination of the contact potential. In first applications of this method we demonstrate that the contact potential can be measured with a sensitivity of at least 100 mV and a local resolution of about 5 m. It seems possible to use the microscopic method described here also for investigating local potentials at low temperatures and even in high magnetic fields. For example, the microscopic study of the Hall voltages in the quantum Hall effect might be an interesting application.

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Section: Pacs: 6116c; 7330mentioning

confidence: 99%

Potentiometry with the acoustic near field microscope: A new method for microscopy of surface potentials

Steinke¹,

Hoffmann²,

Böhmisch³

et al. 1996

Applied Physics A: Materials Science & Processing

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“…erhalten werden. Weitere Begriffe, die im Zusammenhang mit der EFM existieren, sind die Scanning Surface Potential Microscopy (SSPM)146 und die Scanning Kelvin Probe Force Microscopy (SKFM)147 (oder Scanning Kelvin Microscopy (SKM)148), die auf dem Prinzip der SMM beruhen und in der Lage sind, Oberflächenpotentiale und Kontaktpotentialunterschiede (CPDs) abzubilden.…”

Section: üBerblick üBer Die Spm‐technikenunclassified

Klassifikation der rastersondenmikroskopischen Verfahren

Friedbacher

Fuchs

2003

Angewandte Chemie

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In den letzten Jahren hat die Rastersondenmikroskopie eine große Bedeutung in verschiedenen Bereichen der naturwissenschaftlichen und technischen Forschung erlangt. Die Erfindung des Rastertunnelmikroskops im Jahre 1981 hat eine rasante Entwicklung ausgelöst, aus der eine Reihe neuer Oberflächenanalysetechniken hervorgegangen ist, die unter dem Begriff Rastersondenmikroskopie zusammengefasst werden können. Das große Potenzial der Rastersondenmikroskopie findet seinen Niederschlag in weit über 1000 Publikationen pro Jahr. Als Folge der historischen Entwicklung existieren heute für identische Techniken zum Teil mehrere Bezeichnungen und Ausdrücke, die manchmal auch irreführend sind. Daher zielt dieser Bericht auf eine Einteilung der wichtigsten Rastersondentechniken und einen Überblick über sie sowie eine Diskussion der entsprechenden Terminologie ab. Der Schwerpunkt liegt dabei auf der analytischen Bewertung der Rastertunnel‐ und der Rasterkraftmikroskopie, weil diese beiden Techniken bis jetzt die größte Bedeutung für analytische Anwendungen erlangt haben.

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“…[7][8][9][10][11][12] To access mm ranges, either their dimensions are inconveniently large, their deformation has to be amplified by lever systems or they have to be combined with multimorph elements. 13 In addition problems inherent to piezoelectric ceramics like creep, hysteresis and nonlinearity become more and more important, the larger the excursion of the actuators and the lower the scan rates are.…”

Section: Introductionmentioning

confidence: 99%

Versatile three-dimensional cryogenic micropositioning device

Heil

Böhm

Primke

et al. 1996

Review of Scientific Instruments

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A simple design for a mechanically driven three-dimensional cryogenic micropositioner is presented. The design is based on a parallelogram structure constructed from leaf springs and wires. Actuation is achieved by the elastic deformation of the parallelogram by screws. Positions within a volume of roughly (2 mm)3 are attainable. The precision and reproducibility of positioning are in the μm-range. The deviations from linearity are smaller than 10% for the whole working range and the deviation from orthogonality is smaller than 3°. Calibration measurements performed on a Cu-mesh with a lattice constant of 60 μm are presented. In an experiment investigating the ballistic transport of carriers in the semimetal Bi, two such devices are used. The first one is used as a scanning unit for an optical fiber and the second one is used as micropositioner for a Cu point contact.

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The scanning Kelvin microscope

Cited by 43 publications

References 12 publications

Potentiometry with the acoustic near field microscope: A new method for microscopy of surface potentials

Potentiometry with the acoustic near field microscope: A new method for microscopy of surface potentials

Klassifikation der rastersondenmikroskopischen Verfahren

Versatile three-dimensional cryogenic micropositioning device

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