“…FEM is a microscopic technique which has been shown to be sensitive to higher order correlation functions such as g 3 and g 4 and hence to MRO in disordered materials 7,8,20,23,[26][27][28][29][30][31]46 . A statistical analysis of the diffracted intensities I( k, R, r) from nanometer-sized volumes was used by utilizing STEM microdiffraction 25 , where k is the scattering vector, R is the probe size and r is the position on the sample.…”