The role of micro-structural and mechanical properties in the framework of the model for damage inception and growth from air-filled voids in Polyethylene-based materials for HVDC cables

Mazzanti, G.; Montana, G.C.; Testa, L.

doi:10.1109/icsd.2007.4290760

Cited by 3 publications

(3 citation statements)

References 5 publications

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“…Significant research [2][3][4][5][6] has been carried out to study the degradation induced by this type of PD activity. In particular, a physical model of inception and growth of damage from micro-voids in polyethylene-based material under DC was presented in [7][8][9][10]. The results presented in this paper are obtained in the framework of developing an analytical model of the PD-induced degradation processes under AC voltage, occurring within cavities present in insulation systems.…”

Section: Introductionmentioning

confidence: 95%

Relation between the trend of partial discharges and aging models under AC voltage

Wang

Testa

Cavallini

et al. 2009

2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials

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The research work reported in this paper has the aim to contribute in the development of a new physical aging model for damage inception and growth from micro-cavities in polymeric insulating materials subjected to partial discharges (PD) under AC voltage. Aging tests were performed on polyethylene (PE) layered specimens with cylindrical micro-cavities. The PD activity tak ing place inside the micro-cavities was monitored during the aging process. PD patterns, discharge repetition rates and discharge amplitudes were recorded. Common features can be extracted in the changing trend of PD repetition rate and discharge amplitude. Furthermore, damage growth rate, as well as degradation severity, are inferred through simple statistics.

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Section: Introductionmentioning

confidence: 95%

Relation between the trend of partial discharges and aging models under AC voltage

Wang

Testa

Cavallini

et al. 2009

2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials

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“…Damage accumulates at the void-polymer interface at a rate that depends on electron energy distribution (thus, on microvoid size, applied field and temperature, as shown in [1,2]) and material microstructural properties [8]. This growth may result eventually in a conducting pit of critical size dc (i.e.…”

Section: B Avalanche Generation In the Voidmentioning

confidence: 98%

“…Eq =fb qsc (8) After each discharge is completely extinguished, an equal amount of positive (ions) and negative charge (electrons) is deployed on cathode and anode surfaces, respectively. This charge accumulates with that previously deployed, increasing or decreasing the net charge qsc, depending on discharge polarity.…”

Section: (7)mentioning

confidence: 99%

Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage

Montanari

Cavallini

Testa

et al. 2008

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

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Several degradation mechanisms may affect polymeric insulation system reliability. Some authors postulate that, even in a perfect dielectric, nanoscale cavities can enlarge due to various mechanisms (from mechanical fatigue to lowering of the degradation reaction energy barrier) up to a point where highly energetic phenomena, which bring about breakdown, can be incepted. Other authors are more focused on the inherent limits of manufacturing processes, which leave cavities within the insulation system whose size is large enough to cause electron avalanches, thus a measurable partial discharge (PD) activity, from the time the system is put in service or as a function of external factors (e.g. mechanical damage, thermal shrinking, overvoltages). Given the time scale of polymeric system failures, this latter mechanism seems to be more plausible. It is therefore worthwhile to investigate in depth the degradation rates associated with PD in micrometric cavities in polymeric insulation systems subjected to AC voltage. The proposed model is based on damage accumulation on cavity surfaces caused by PD phenomena. The main degradation mechanism associated with PD is considered to be the hotelectron induced bond-breaking process. This process accumulates with time, leading to the creation of a damaged region of critical size and, ultimately, to breakdown. The proposed model describes the defect induction and growth phase until treeing phenomena start, which is, normally, the largely prevailing component of breakdown time.

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Bibliography of HVDC transmission 2007-2008 Part I: IEEE working group report

Berge

Varma

Litzenberger

2009

2009 IEEE Power &Amp; Energy Society General Meeting

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The role of micro-structural and mechanical properties in the framework of the model for damage inception and growth from air-filled voids in Polyethylene-based materials for HVDC cables

Cited by 3 publications

References 5 publications

Relation between the trend of partial discharges and aging models under AC voltage

Relation between the trend of partial discharges and aging models under AC voltage

Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage

Bibliography of HVDC transmission 2007-2008 Part I: IEEE working group report

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