2012
DOI: 10.1016/j.corsci.2011.11.021
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The role of cold work and applied stress on surface oxidation of 304 stainless steel

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Cited by 121 publications
(50 citation statements)
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“…In addition, no interaction between the c 0 free band and the oxide layer was observed in this study: localization bands were not preferential channels of oxide penetration in the base metal. This conclusion is in opposition to studies [16,20,22,23], reporting that the deformation bands present in 304L stainless steel exposed to PWR water may enhance the oxidation rate. For example, Lozano-Perez et al [23] indicate that prior cold work may facilitate oxidation in deformation bands by providing a density of dislocations acting as fast diffusion paths for oxygen and iron.…”
Section: Study Of Intergranular Oxide Penetrationcontrasting
confidence: 54%
“…In addition, no interaction between the c 0 free band and the oxide layer was observed in this study: localization bands were not preferential channels of oxide penetration in the base metal. This conclusion is in opposition to studies [16,20,22,23], reporting that the deformation bands present in 304L stainless steel exposed to PWR water may enhance the oxidation rate. For example, Lozano-Perez et al [23] indicate that prior cold work may facilitate oxidation in deformation bands by providing a density of dislocations acting as fast diffusion paths for oxygen and iron.…”
Section: Study Of Intergranular Oxide Penetrationcontrasting
confidence: 54%
“…10. The migration of O 2 and SO 2 was faster in dislocation aggregated areas than in grains, 18 resulting in forming the protective Cr rich layer easily in a simulated environment. A protective Cr rich layer effectively prevents the outward diffusion of Fe ions.…”
Section: Eds Analysis Results Of Samples From Bends 6 Eds Surface Anamentioning
confidence: 98%
“…Once tested, the cantilevers were then imaged in a FIB-SEM (Zeiss NVision), where the FIB 3D slicing technique was used to reconstruct the oxidized grain boundary portion of the cantilever in 3D. More details about this technique can be found in [5]. (S)TEM characterization was performed in a Jeol 3000F equipped with an ultrathin polymer window Oxford Instruments EDX detector and operated at 297keV.…”
Section: Methodsmentioning
confidence: 99%