The reliability of bypass diodes in PV modules

Dhere, Neelkanth G.; Shiradkar, Narendra; Schneller, Eric; Gade, Vivek

doi:10.1117/12.2026782

Cited by 36 publications

(30 citation statements)

References 1 publication

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“…Typically, a large number of cell strips are connected in series in monolithically integrated thin film PV modules without any bypass diodes per cell string. The lack of protection offered by bypass diodes in this type of electrical arrangement makes thin film modules especially vulnerable to partial shading-induced failures [1]. An older generation CIGS PV module array was deployed at the Florida Solar Energy Center (FSEC) during the year 2002.…”

Section: Introductionmentioning

confidence: 99%

Effect of shading on CIGS thin film photovoltaic modules

Dhere

Schneller

Kaul

2015

2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)

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Power output of PV systems reduces when they are fully or partially shaded. Full shading can occur as a result of reduction in irradiance due to cloud cover while partial shading occurs due to nearby objects. The temporary loss of power due to full or partial shading of PV systems has been well investigated in the published literature. However, shading can induce failures in PV modules and cause permanent power loss or compromise the safety. This paper discusses shading-induced reliability issues in copper-indium-gallium-selenide thin film PV modules deployed at the Florida Solar Energy Center for over 12 years.

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Section: Introductionmentioning

confidence: 99%

Effect of shading on CIGS thin film photovoltaic modules

Dhere

Schneller

Kaul

2015

2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)

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“…We then demonstrate the ability of this approach to investigate two important failure mechanisms in the field, namely: (a) local series resistance issues, such as isolated or poorly connected regions, and (b) bypass diode (BPD) failure in open‐circuit (OC) condition. The failure of BPDs is difficult to detect in the field which can lead to module destruction and even represents a severe fire hazard under local shading conditions …”

Section: Introductionmentioning

confidence: 99%

Outdoor photoluminescence imaging of solar panels by contactless switching: Technical considerations and applications

Bhoopathy

Kunz

Juhl

et al. 2019

Progress in Photovoltaics

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Monitoring the performance of solar modules in a photovoltaic system is critical in order to understand the health of the system. Existing methods for field inspection have limited capability of detecting various electronic defects that can, however, be identified with luminescence‐based methods. A contactless outdoor photoluminescence‐imaging based measurement method that uses the sun as the excitation source was presented in our earlier work. This paper extends our previous work and presents two unique applications to (a) identify and quantify local areas of high series resistance within the cells and (b) identify bypass diodes that have failed in open‐circuit. The paper also discusses specific technical considerations of this method. The main merit of this method is that it can be used when the module is under normal operation in the field, without requiring changing of the electrical wiring of the photovoltaic array.

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“…1(b) and 1(c) show the top and cross-sectional views of the custom laminate, respectively (patent pending). 18 At FSEC, several commercial multicrystalline silicon PV modules were deployed on an outdoor test bed with an applied voltage bias of À600 V with respect to ground. Measurements of the leakage current flowing through the module packaging materials, along with all relevant meteorological parameters, were recorded every minute.…”

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confidence: 99%

“…The parameter U EVA is the effective length of the EVA strip between the edge of the cell and a point in the interior of the cell from which the current can be assumed to flow upward and is estimated from the finite element analysis simulations. 18 The following parameters values are used in this study: L ¼ 1.65 m, W ¼ 1 m, S ¼ 0.02 m, q glass ¼ 5 Â 10 10 X-m, U EVA ¼ 0.005 m, and t glass ¼ 0.0032 m. The parameter N module is calculated to be 265 from…”

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confidence: 99%