Sintering - Methods and Products 2012
DOI: 10.5772/34400
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The Quantification of Crystalline Phases in Materials: Applications of Rietveld Method

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Cited by 6 publications
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“…Under such situations, XRD is a very appropriate technique to investigate the microstructure as it gives information from a macroscopic area in a statistically averaged manner. The method is also appropriate to study the microstructure of a dual-phase Ti6Al4V as the peaks corresponding to constituent phases appear distinctly due to differences of the diffraction vectors (interplanar spacing) [18].…”
Section: Introductionmentioning
confidence: 99%
“…Under such situations, XRD is a very appropriate technique to investigate the microstructure as it gives information from a macroscopic area in a statistically averaged manner. The method is also appropriate to study the microstructure of a dual-phase Ti6Al4V as the peaks corresponding to constituent phases appear distinctly due to differences of the diffraction vectors (interplanar spacing) [18].…”
Section: Introductionmentioning
confidence: 99%