1978
DOI: 10.1016/0029-554x(78)90153-2
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The (pX, X) experiment — A new approach for partial sensitivity enhancement in trace element analysis

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Cited by 26 publications
(2 citation statements)
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“…The advantages for such an x-ray source are mainly related to the high inner shell ionization cross sections of heavy ions, and most important with the very low emission, compared to electrons, of bremsstrahlung radiation as the ions decelerate into matter resulting in an improved peak to background ratio. 1 The concept of the proton-induced monochromatic x-ray beams [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19] has been utilized in the past in various spectroscopy and analytical studies related with the determination of impurities or minor elements in pure metal matrices, [8][9][10][11][12] as well as for inelastic x-ray scattering experiments in experimental conditions (exciting x-ray beam energy, atomic number of the target element) that favour the study of x-ray resonant Raman scattering (RRS) [13][14][15][16] and more recently for the production of soft keV micro-focused x-rays for single cell irradiation allowing for a more consistent dose delivery. 19 Here, through the development of an integrated x-ray spectroscopy end station, we describe the dynamic utilization of the advantages of proton-induced x-ray beams when used for soft x-ray spectroscopy applications and especially for XRF analytical purposes.…”
Section: Introductionmentioning
confidence: 99%
“…The advantages for such an x-ray source are mainly related to the high inner shell ionization cross sections of heavy ions, and most important with the very low emission, compared to electrons, of bremsstrahlung radiation as the ions decelerate into matter resulting in an improved peak to background ratio. 1 The concept of the proton-induced monochromatic x-ray beams [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19] has been utilized in the past in various spectroscopy and analytical studies related with the determination of impurities or minor elements in pure metal matrices, [8][9][10][11][12] as well as for inelastic x-ray scattering experiments in experimental conditions (exciting x-ray beam energy, atomic number of the target element) that favour the study of x-ray resonant Raman scattering (RRS) [13][14][15][16] and more recently for the production of soft keV micro-focused x-rays for single cell irradiation allowing for a more consistent dose delivery. 19 Here, through the development of an integrated x-ray spectroscopy end station, we describe the dynamic utilization of the advantages of proton-induced x-ray beams when used for soft x-ray spectroscopy applications and especially for XRF analytical purposes.…”
Section: Introductionmentioning
confidence: 99%
“…Στις περιπτώσεις αυτές με την κατάλληλη επιλογή του αρχικού στόχου που βομβαρδίζεται απο πρωτόνια μπορεί να επιτευχθεί μια επιλεκτική διέγερση στο προς ανάλυση δείγμα μόνο εκείνων των στοιχείων που ενδιαφέρουν. Ενδεικτικά αναφέρω την μέτρηση απο τους Lin et al [152] μικρών ποσοτήτων Co παρουσία μεγάλων συγκεντρώσεων Νί με την χρήση των χαρακτηριστικών ακτινών χ του Cu, την μέτρηση Cr σε χάλυβες με σχετικό σφάλμα 1.8 % στο εύρος συγκεντρώσεων απο 2 -18 % απο τον Gihwala et al [153] και την επίτευξη μικρών ανιχνεύσιμων ορίων για το Fe σε μήτρα Cu [154]. Στις εργασίες αυτές δεν έχουν παρουσιασθεί αλλά και ούτε έχουν διερευνηθεί πειραματικά με σαφή και ολοκληρωμένο τρόπο, εκτός ίσως της επιλεκτικότητας στην διέγερση που επιτυγχάνεται με την PIXRF, ό λες οι δυνατότητες που προσφέρει η PIXRF στην ποσοτική ανάλυση διαφόρων δειγμάτων και στην επίτευξη χαμηλότερων ανιχνεύσιμων ορίων.…”
Section: εισαγωγήunclassified