2010
DOI: 10.1163/016942410x508325
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The Pull-Off Force and the Work of Adhesion: New Challenges at the Nanoscale

Abstract: The pull-off force required to separate two surfaces has become a convenient metric for characterizing adhesion at the micro-and nanoscales using cantilever-based force sensors, such as an atomic force microscope (AFM), e.g., as a way to predict adhesion between materials used in MEMS/NEMS. Interfacial Force Microscopy (IFM) provides unique insight into this method, because its self-balancing force-feedback sensor avoids the snap-out instability of compliant sensors, and can estimate both the work of adhesion … Show more

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Cited by 22 publications
(27 citation statements)
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“…The forces on approach at the lowest biases (<3 V, Figure 2) are characteristically similar to those observed earlier with IFM involving capillary condensation between other insulating surfaces, including NaCl, diamond, poly(vinyl acetate) and carboxylated self-assembled monolayers (SAMs), 10,11,41,42 supporting that the transition at D* stemmed from capillary condensation and not from electrical discharge. Both the discontinuity in the force at D* and the linear scaling of the force with separation for D < D* are established features of capillary nanobridges at constant vapor pressure (for reviews of surface forces, see refs 3, 8, 22, and 43).…”
Section: ' Methods and Materialssupporting
confidence: 83%
See 1 more Smart Citation
“…The forces on approach at the lowest biases (<3 V, Figure 2) are characteristically similar to those observed earlier with IFM involving capillary condensation between other insulating surfaces, including NaCl, diamond, poly(vinyl acetate) and carboxylated self-assembled monolayers (SAMs), 10,11,41,42 supporting that the transition at D* stemmed from capillary condensation and not from electrical discharge. Both the discontinuity in the force at D* and the linear scaling of the force with separation for D < D* are established features of capillary nanobridges at constant vapor pressure (for reviews of surface forces, see refs 3, 8, 22, and 43).…”
Section: ' Methods and Materialssupporting
confidence: 83%
“…Because force cannot be measured during the last 1À2 nm of separation, owing to the elastic instability of the surfaces themselves under van der Waals attraction, this approach may underestimate D C by <1À2 nm. 10 Although the applied fields of up to ∼10 9 V/m are much higher than the field required for dielectric breakdown of air (∼3 Â 10 6 V/m), the transition at D* is distinct from what has been observed during discharging of other insulating surfaces. The latter has been characterized as a series of force excursions that lessen the magnitude of force as potential is relieved.…”
Section: ' Methods and Materialsmentioning
confidence: 93%
“…In another study, the IFM was used to study a silicon/silicon interface under a variety of conditions. [ 35 ] Results varied widely between different tests, even for similar conditions. For instance, for self-mated silicon interfaces (with a native oxide) in air, work of adhesion values were reported to range from [ 32 ] 0.040 J m −2 up to [ 12 ] 0.83 J m −2 -likely due to differences in roughness and surface preparation.…”
Section: Introductionmentioning
confidence: 97%
“…This quantity is the correct one for use in continuum contact models [4][5][6]8,27,28 ] as well as in roughness models. [ 26,29,30 ] The investigations in this second category have employed the atomic force microscope (AFM), [ 8,12,[31][32][33][34] the related interfacial force microscope (IFM), [ 35 ] and the surface forces apparatus (SFA) [ 36,37 ] to conduct adhesion tests with high-force resolution using a single-asperity contact, typically on the nanometer length scale. Since these are not fl at surfaces, a value for work of adhesion requires using a contact mechanics model to fi t the data.…”
Section: Introductionmentioning
confidence: 99%
“…Several authors have used IFM to study the range of formation, the interaction force, and the viscoelastic properties of nanomenisci [8,10,29,107]. These studies have shown unprecedented detail in the force that evolves between a probe and nearby surface as vapor condenses into liquid and is displaced beneath the approaching probe.…”
Section: Hydration Repulsion Inside a Nanoconfined Meniscusmentioning
confidence: 99%