1978
DOI: 10.1016/0039-6028(78)90057-2
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The projection geometry of the field-ion image

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Cited by 24 publications
(9 citation statements)
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“…For the emitter shapes considered in this study the closest standard projection was found to be the stereographic one. These results correlate closely with some recent measurements made by Southworth and Walls (1978), but are at variance with the widely quoted results obtained by Brandon (1964) who suggested that the use of the N = 2 projection would be more accurate. It has been shown analytically that not only are the ion trajectories independent of q and m, but they are also independent of the potential difference V between tip and screen.…”
Section: Discussionsupporting
confidence: 91%
“…For the emitter shapes considered in this study the closest standard projection was found to be the stereographic one. These results correlate closely with some recent measurements made by Southworth and Walls (1978), but are at variance with the widely quoted results obtained by Brandon (1964) who suggested that the use of the N = 2 projection would be more accurate. It has been shown analytically that not only are the ion trajectories independent of q and m, but they are also independent of the potential difference V between tip and screen.…”
Section: Discussionsupporting
confidence: 91%
“…[327][328][329][330] The geometry of the specimen provides the projection with a magnification in the range of 10 6 , so interatomic distances can in principle be resolved. [331] Time-control over the field evaporation process is gained by either superimposing high-voltage pulses [332] of short laser pulses [333][334][335] onto a direct current (DC) voltage. Knowing when the ion is generated and when it strikes the detector allows for performing time-of-flight mass spectrometry, thereby enabling the identification of the elemental nature of each collected ion.…”
Section: B Atom Probe Tomography For the Investigation Of Advanced Smentioning
confidence: 99%
“…Then, the position of the surface of the sample ( x , y ) are deduced from the ion's impact on the detector ( X , Y ), thanks to a projection law (Southworth & Walls, 1978), equation (12):…”
Section: Simulation Results and Discussionmentioning
confidence: 99%