The profilometer for ION beams

Abstract

The concept of a real-time profilometer for ion beam is considered in this paper. The profilometer hardware is based on X-Y collector electrodes and the software based on LabVIEW from National Instruments. The software algorithm allows for statistical analysis and the visualization of beam current distribution. The concept of the profilometer was tested on the isochronous Eclipse Cyclotron produced by Siemens.