Abstract:In this report, a probe mark discoloration with donut/circle shape was found. The corrosion formed on Aluminum bond pads. The SEM/EDS, TEM/EELS & AES surface techniques were used to identify this corrosion product. All these material analysis results pointed out the role of fluorine to this discoloration. The HAST testing, all the chip samples obtained from wafer center/middle area, were simulated to have been exposed in air for 1 year. HAST test result showed no fluorine source came from the center/middle zon… Show more
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