The preparation of beryllium specimens for transmission electron microscopy by the Knuth system of electropolishing

Wilhelm, Franz

doi:10.1088/0950-7671/41/5/439

Cited by 5 publications

(3 citation statements)

References 4 publications

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“…133 The thin metal foils are usually of a thickness of a few hundred nanometres or less. 141,142 In addition, the successful TEM analysis highly depends on the quality of the thin metal foils prepared. Although pure mechanical polishing technique exists to make the TEM thin specimen, the sample quality usually is hard to be fully controlled.…”

Section: Electropolishing Evaluation With Microscopementioning

confidence: 99%

Electropolishing of surfaces: theory and applications

Yang

Wang

Tawfiq

et al. 2017

Surface Engineering

119

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Electropolishing is the electrochemical process to remove the metallic material from the workpiece, in order to obtain a smoother metal surface. It has found vast engineering applications in many fields, such as food, medical, pharmaceutical and semiconductor industries. This review is aimed to provide the readership with insightful understanding of the electropolishing process, from the fundamental aspects as well as from the application aspects. The general aspects of electropolishing, including its definition, the classic setup, the fundamentals behind it and methods used to evaluate the electropolishing finishes are reviewed here. Various electropolishing theories, be them quantitative or qualitative are briefly discussed. Based on those theories, important parameters evolved in the electropolishing process are enumerated. Many microscopic technologies are used to evaluate the electropolishing surface finishes. This includes optical microscope, electron microscope and atomic force microscope. Some key features of electropolishing are briefly outlined in the end.

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Section: Electropolishing Evaluation With Microscopementioning

confidence: 99%

Electropolishing of surfaces: theory and applications

Yang

Wang

Tawfiq

et al. 2017

Surface Engineering

119

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“…The surroundings of the small perforation are sufficiently thin for TEM. The achieved specimen is free of mechanical or ion damage, typically shows large regions of electron transparent material, requires no grid to be mounted on the TEM holder and is easy to handle due to the rigid rim which supports and protects the thin area in the center (Heidenreich, 1949; Wilhelm, 1964). Also heating of the specimen by the electron beam during TEM investigations remains limited since the heat generated in the thin region is rapidly dissipated by the rather thick surroundings (Van Torne & Thomas, 1965).…”

Section: Introductionmentioning

confidence: 99%

Twin‐jet electropolishing for damage‐free transmission electron microscopy specimen preparation of metallic microwires

Pourbabak

Orekhov

Schryvers

2020

Microscopy Res & Technique

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A method to prepare TEM specimens from metallic microwires and based on conventional twin‐jet electropolishing is introduced. The wire is embedded in an opaque epoxy resin medium and the hardened resin is mechanically polished to reveal the wire on both sides. The resin containing wire is then cut into discs of the appropriate size. The obtained embedded wire is electropolished in a conventional twin‐jet electropolishing machine until electron transparency in large areas without radiation damage is achieved.

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“…In addition, the success of the microstructural analysis critically depends on the quality of the thin foils prepared [7,8]. Compared to TEM analysis of un-irradiated materials, for irradiated materials, the sample preparation methodologies are more complicated and are challenging task due to the activity of the samples.…”

Section: Introductionmentioning

confidence: 99%

TEM Foil Preparation from Irradiated Metallic Materials: A Practical Approach

Namburi¹,

Bublíkova²,

Rosnecky³

et al. 2015

JESE-B

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This paper focuses on work related to post irradiation examination of 300-series austenitic stainless steel taken from reactor vessel internals of PWR. High neutron irradiation dose in NNP's leads to a degradation of microstructure of the material in a nano-metric scale. Hence, it is important to characterize the irradiated materials to understand the physical basis of the degradation mechanisms. Microstructural characterization of neutron-irradiated materials by TEM requires enhanced sample preparation methodologies, which commonly needs general improvements regarding particular experiment to be performed. In this study, the authors have developed methodology specialized in 1 mm TEM thin foil preparation from a deformed shank of a broken miniaturized tensile specimen. TEM foil size in current studies is smaller than standard because of the small shank diameter and high radioactivity of the studied material. The reduction of the TEM foil radioactivity to minimum is crucial to perform EDX chemical analysis and to increase the EDX detector lifetime. This paper describes whole process from bulk sample handling, including remote-controlled material cutting in shielded hot-cells and disc polishing in glow-boxes, up to the final procedure of electrolytic-polishing of electron transparent 1 mm TEM foils. Eventually, results of TEM microanalysis of radiation-induced defects were present.

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The preparation of beryllium specimens for transmission electron microscopy by the Knuth system of electropolishing

Cited by 5 publications

References 4 publications

Electropolishing of surfaces: theory and applications

Electropolishing of surfaces: theory and applications

Twin‐jet electropolishing for damage‐free transmission electron microscopy specimen preparation of metallic microwires

TEM Foil Preparation from Irradiated Metallic Materials: A Practical Approach

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