Poly(vinylidene fluoride) (PVF2) exhibits at least four crystalline forms, c~, fl, 7 and 6, among which the/~ phase is the most important because of its extensive applications in piezoelectric and pyroelectric properties. Many attempts have been made to prepare /~-form PVF2 by various methods which include growth from solution [1], mechanical deformation [2-5], crystallization at elevated pressures [6][7][8], application of a strong electric field [9][10][11] and the copolymerization with other fluorocarbons (i.e. trifluoro-or tetrafluoroethylene) [12,13]. Generally, in the sample of PVF 2 cooled from the melt, the e phase is predominant and transition to the /3 form has to be performed by stretching. It would be very important if it were possible to prepare directly the fl phase from the melt. The only reported/~ crystallization of pure PVF 2 from the melt at atmospheric pressure was described by Lovinger [14] based on epitaxial growth on the surface of potassium bromide. However, no systematic investigation has been carried out on the temperature dependence of melt-grown/?-crystals.The purpose of this letter is to focus on the effects of quenching and then annealing on the /~-phase formation from the melt of PVF2 by means of FTIR, X-ray diffraction and electron microscopy.The PVF 2 (mol. wt = 5 x 105 ) utilized in this work was supplied by Polysciences, Inc. Films were either cast from cyclohexanone solutions on to glass plates or compression moulded. The thickness of the samples is about 5/~m for FTIR and X-ray diffraction analysis and about 100nm for electron microscopy studies. The two types of films were supported on a thin sheet of mica and were melted at 210°C for 10rain and then quenched quickly in a bath in the