2016
DOI: 10.1016/j.nima.2015.12.003
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The pixel tracking telescope at the Fermilab Test Beam Facility

Abstract: An all silicon pixel telescope has been assembled and used at the Fermilab Test Beam Facility (FTBF) since 2009 to provide precise tracking information for different test beam experiments with a wide range of Detectors Under Test (DUTs) requiring high resolution measurement of the track impact point. The telescope is based on CMS pixel modules left over from the CMS forward pixel production. Eight planes are arranged to achieve a resolution of less than 8 μm on the 120 GeV proton beam transverse coordinate at … Show more

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Cited by 20 publications
(17 citation statements)
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“…Thin n-on-p pixel sensors with 100 and 130 µm active thickness were produced by FBK Italy [7], and studied in a test beam campaign at FNAL (120 GeV protons at the FNAL MTest facility [8]). The collected charge was measured before and after irradiation with 800 MeV protons at Los Alamos to 1.2 × 10 15 n eq /cm 2 .…”
Section: First Randd Resultsmentioning
confidence: 99%
“…Thin n-on-p pixel sensors with 100 and 130 µm active thickness were produced by FBK Italy [7], and studied in a test beam campaign at FNAL (120 GeV protons at the FNAL MTest facility [8]). The collected charge was measured before and after irradiation with 800 MeV protons at Los Alamos to 1.2 × 10 15 n eq /cm 2 .…”
Section: First Randd Resultsmentioning
confidence: 99%
“…The FTBF is equipped with a silicon tracking telescope to measure the position of each incident proton [11]. The telescope consists of four pixel layers with cell size 100 × 150 µm 2 , and fourteen strip modules with 60 µm pitch, in alternating orientation along the x-and y-axes of the plane orthogonal to the beam axis.…”
Section: Fermilab Test Beam Facility Experimentsmentioning
confidence: 99%
“…The trigger was based on a 10 cm 2 scintillation counter located a few meters upstream with respect to the experimental setup, as shown in Figure 1. A silicon tracker telescope [2] consisting of twelve strip modules with 60 𝜇m pitch, in alternating orientation along orthogonal directions, and located in front of the crystals and SiPMs under test, determined the impact point of the beam particles with a precision of about 0.2 mm. The crystals and SiPMs were located inside a dark box with its temperature maintained at about 25 ± 1 • C using a thermoelectric cooler and monitored by a thermistor located close to the SiPMs.…”
Section: Experimental Setup 21 the Beam Linementioning
confidence: 99%