2014 IEEE International Reliability Physics Symposium 2014
DOI: 10.1109/irps.2014.6860667
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The physical mechanism investigation of AC TDDB behavior in advanced gate stack

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Cited by 13 publications
(1 citation statement)
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“…Based on the literature (Chen et al 2013;Chenot et al 2007), it was expected that those examiners who have more academic experience would show higher correlations between marks and this was the general trend except for E11 and E12 who were sort of an outlier in this study. The fact that E11 and E12 had a high inter examiner correlation could stem from the type of skill question they examined.…”
Section: Discussionmentioning
confidence: 80%
“…Based on the literature (Chen et al 2013;Chenot et al 2007), it was expected that those examiners who have more academic experience would show higher correlations between marks and this was the general trend except for E11 and E12 who were sort of an outlier in this study. The fact that E11 and E12 had a high inter examiner correlation could stem from the type of skill question they examined.…”
Section: Discussionmentioning
confidence: 80%