The photoemission spectromicroscope multiple‐application x‐ray imaging undulator microscope (<scp>maximum</scp>)

Ng, W.; Ray-Chaudhuri, Avijit K.; Crossley, Sherry L.; Crossley, Dennis B.; Gong, Cheng; Guo, Jinghua; Hansen, R.G.; Margaritondo, G.; Cerrina, F.; Underwood, J. H.; Perera, R. C. C.; Kortright, Jeffrey B.

doi:10.1116/1.576736

Cited by 30 publications

(2 citation statements)

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“…In the case of electron emission (reviewed in Ade, 1992), scanning with zoneplate-focused soft X-rays in the Brookhaven SPEM has been used to obtain chemical and compositional information from the surfaces of aluminium and silicon at a resolution of 0.1-0.41.tm (Ade et al, 1991). Other types of optics, including Schwarzschild mirror optics have also been used (Ng et al, 1990).…”

Section: More Advanced Imaging X-ray Microspectroscopy and Compomentioning

confidence: 99%

X-ray microscopy

Sayre

Chapman²

1995

Acta Crystallogr A Found Crystallogr

110

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The subject of X-ray microscopy (high-resolution X-ray imaging of general nonperiodic structures), an area in which much progress has been made in recent years, is reviewed. The main techniques are briefly described. Achievable performance levels, which for many years were highly speculative, can now be understood with fair accuracy in terms of basic X-ray and specimen properties, and techniques have progressed to the point where actual results are nearing those levels. In terms of specimen size and imaging resolution, X-ray microscopies lie between electron and light microscopy, and are thus suited to imaging extremely large and complex structures; in addition, they demand little or no specimen preparation, and can be used to observe local composition and chemical state as well as structure. Thus X-rays, which have played the leading role in imaging crystallizable materials, may also prove to be highly valuable in the imaging of very large non-crystalline structures. Throughout the treatment, attention is paid to the relationships connecting the subject with X-ray crystallography.

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Section: More Advanced Imaging X-ray Microspectroscopy and Compomentioning

confidence: 99%

X-ray microscopy

Sayre

Chapman²

1995

Acta Crystallogr A Found Crystallogr

110

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show abstract

“…The photoelectrons emitted from the irradiated spot are detected, and used to form the image. For low energy operation (<280 eV) the microprobe can be formed using a Schwarzschild objective , as at the SRC in Wisconsin (27,34). The instrument based on a grazing incidence ellipsoidal mirror at HASYLAB (35), and one using a zone plate can operate at higher energies.…”

Section: Soft X-ray Microscopy -Instrumentationmentioning

confidence: 99%